Electronic component search and free download site.
Transistors,MosFET ,Diode,Integrated circuits
Part Name  
Home >>> Texas-Instruments >>> LVT8980A Datasheet

LVT8980A Datasheet

Part NameDescriptionManufacturer
LVT8980A EMBEDDED TEST-BUS CONTROLLERS IEEE STD 1149.1 (JTAG) TAP MASTER WITH 8-BIT GENERIC HOST INTERFACES Texas-Instruments
Texas Instruments Texas-Instruments
PDF DOWNLOAD     
SN74LVT8980A image

description
The ’LVT8980A embedded test-bus controllers (eTBCs) are members of the TI broad family of testability integrated circuits. This family of devices supports IEEE Std 1149.1-1990 boundary scan to facilitate testing of complex circuit assemblies. Unlike most other devices of this family, the eTBCs are not boundary-scannable devices; rather, their function is to master an IEEE Std 1149.1 (JTAG) test access port (TAP) under the command of an embedded host microprocessor/microcontroller. Thus, the eTBCs enable the practical and effective use of the IEEE Std 1149.1 test-access infrastructure to support embedded/built-in test, emulation, and configuration/maintenance facilities at board and system levels.

● Members of Texas Instruments Broad Family of Testability Products Supporting IEEE Std 1149.1-1990 (JTAG) Test Access Port (TAP) and Boundary-Scan Architecture
● Provide Built-In Access to IEEE Std 1149.1 Scan-Accessible Test/Maintenance Facilities at Board and System Levels
● While Powered at 3.3 V, the TAP Interface Is Fully 5-V Tolerant for Mastering Both 5-V and/or 3.3-V IEEE Std 1149.1 Targets
● Simple Interface to Low-Cost 3.3-V Microprocessors/Microcontrollers Via 8-Bit Asynchronous Read/Write Data Bus
● Easy Programming Via Scan-Level Command Set and Smart TAP Control
● Transparently Generate Protocols to Support Multidrop TAP Configurations Using TI’s Addressable Scan Port
● Flexible TCK Generator Provides Programmable Division, Gated-TCK, and Free-Running-TCK Modes
● Discrete TAP Control Mode Supports Arbitrary TMS/TDI Sequences for Noncompliant Targets
● Programmable 32-Bit Test Cycle Counter Allows Virtually Unlimited Scan/Test Length
● Accommodate Target Retiming (Pipeline) Delays of up to 15 TCK Cycles
● Test Output Enable (TOE) Allows for External Control of TAP Signals
● High-Drive Outputs (−32-mA IOH, 64-mA IOL) at TAP Support Backplane Interface and/or High Fanout

 

Other manufacturer searches related to LVT8980A

Part NameDescriptionPDFManufacturer
SN54LVT8980A EMBEDDED TEST-BUS CONTROLLERS IEEE STD 1149.1 (JTAG) TAP MASTER WITH 8-BIT GENERIC HOST INTERFACES View Texas Instruments
1L8980DWRG4 EMBEDDED TEST-BUS CONTROLLERS IEEE STD 1149.1 (JTAG) TAP MASTERS WITH 8-BIT GENERIC HOST INTERFACES View Texas Instruments
LVT8980AEP EMBEDDED TEST-BUS CONTROLLER IEEE STD 1149.1 (JTAG) TAP MASTERS WITH 8-BIT GENERIC HOST INTERFACES View Texas Instruments
LPM-NE2000 Ethernet LAN Card STD BUS, CMOS STD BUS View Unspecified
SCANPSC110F SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port (IEEE1149.1 System Test Support) View National ->Texas Instruments
BH-USB-200 Blackhawkk USB200 XDS200 JTAG Emulator for TI Embedded Processors View Unspecified
TSB83AA23 IEEE Std 1394b-2002 PHY AND OHCI LINK DEVICE View Texas Instruments
EPF011A Generic MCU with 64K Embedded Flash View Unspecified
BUS-61559-883B MIL-STD-1553B NOTICE 2 ADVANCED INTEGRATED MUX HYBRIDS with ENHANCED RT FEATURES(AIM-HYer) View Unspecified
MB86967 LAN Controller with PC Card, ISA Bus, and General-purpose Bus Interfaces View Fujitsu

Share Link : 
All Rights Reserved© datasheetq.com 2015 - 2019  ] [ Privacy Policy ] [ Request Datasheet  ] [ Contact Us ]