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Manufacturer Part no Description View
TI
Texas Instruments
SN74BCT8240ANTE4 SCAN TEST DEVICES WITH OCTAL BUFFERS

description
The ’BCT8240A scan test devices with octal buffers are members of the Texas Instruments SCOPE testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.
In the normal mode, these devices are functionally equivalent to the ’F240 and ’BCT240


other parts : 5962-9174601Q3A 5962-9174601QLA SN54BCT8240A SN54BCT8240AFK SN54BCT8240AJT SN74BCT8240A SN74BCT8240ADW SN74BCT8240ADWE4 SN74BCT8240ADWRE4 SN74BCT8240ANT 
Vicor
Vicor
VI-2NTEW DC-DC Converters 50 to 200 Watts

Product Highlights
The VI-200 Family, with over 8 million shipped, is Vicor’s first generation of “zero-current switching” component-level DC-DC converters. Operating at frequencies up to 2 MHz, VI-200 Family Converters offer exceptional power density, efficiency, noise performance, reliability and ease of use. Power Boosters provide a simple, cost effective, off-the-shelf solution for higher
power output requirements. One or more boosters may be used to create


other parts : VI-200CU VI-200CV VI-200CW VI-200CX VI-200CY VI-200EU VI-200EV VI-200EW VI-200EX VI-200EY 
Vicor
Vicor
VI-JNTEX MiniMod DC-DC Converters 25 to 100 Watts

Features
■Up to 50W/Cubic Inch
■UL, CSA, TÜV, VDE, BABT
■CE Marked
■Up to 90% Efficiency
■Size: 2.28" x 2.4" x 0.5" (57,9 x 61,0 x 12,7)
■Remote Sense and Current Limit
■Logic Disable
■Wide Range Output Adjust
■ZCS Power Architecture
■Low Noise FM Control


other parts : VI-J00 VI-J00-CW VI-J00-CW-F1 VI-J00-CW-F2 VI-J00-CW-S VI-JT3-EW VI-J00-CX VI-J00-CX-F1 VI-J00-CX-F2 VI-J00-CX-S 
TI
Texas Instruments
SN74HC646NTE4 OCTAL BUS TRANSCEIVERS AND REGISTERS WITH 3-STATE OUTPUTS

Independent Registers for A and B Buses
Multiplexed Real-Time and Stored Data
True Data Paths
High-Current 3-State Outputs Can Drive up to 15 LSTTL Loads
Package Options Include Plastic Small-Outline (DW) and Ceramic Flat (W) Packages, Ceramic Chip Carriers (FK), and Standard Plastic (NT) and Ceramic (JT) 300-mil DIPs


other parts : SN54HC646 SN74HC646 SN74HC646DW SN74HC646DWG4 SN74HC646DWR SN74HC646NT SN74HC646NT3 
TI
Texas Instruments
SN74ALS876ANTE4 DUAL 4-BIT D-TYPE EDGE-TRIGGERED FLIP-FLOPS

description
These dual 4-bit D-type edge-triggered flip-flops


other parts : 84010013A 8401001KA 8401001LA SN54ALS874B SN54ALS874BFK SN54ALS874BJT SN74ALS874B SN74ALS874BDW SN74ALS874BDWE4 SN74ALS874BDWG4 
TI
Texas Instruments
THS4271MDGNTEP LOW NOISE, HIGH SLEW RATE, UNITY GAIN STABLE VOLTAGE FEEDBACK AMPLIFIER

DESCRIPTION
The THS4271 is a low-noise, high slew rate, unity gain stable voltage-feedback amplifier designed to run from supply voltages as low as 5 V. The combination of low-noise, high slew rate, wide bandwidth, low distortion, and unity gain stability make the THS4271 a high performance device across multiple ac specifications.


other parts : THS4271-EP THS4271MDGNREP V62/05610-01YE 
TI
Texas Instruments
SN74BCT646NTE4 OCTAL BUS TRANSCEIVERS AND REGISTERS WITH 3-STATE OUTPUTS

description/ordering information
These devices consist of bus transceiver circuits, D-type flip-flops, and control circuitry arranged for multiplexed transmission of data directly from the input bus or from the internal registers. Data on the A or B bus is clocked into the registers on the low-to-high transition of the appropriate clock (CLKAB or CLKBA) input. Figure 1 illustrates the four fundamental bus-management functions that can be performed with the ’BCT646


other parts : 5962-9155501M3A 5962-9155501MLA BCT646 SN54BCT646 SN54BCT646FK SN54BCT646JT SN54BCT646W SN74BCT646 SN74BCT646DW SN74BCT646DWE4 
TI
Texas Instruments
SN74BCT8373ANTE4 SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES

description
The ’BCT8373A scan test devices with octal D-type latches are members of the Texas Instruments SCOPE testability integrated circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.

Members of the Texas Instruments SCOPEFamily of Testability Products
Octal


other parts : 5962-9172501M3A 5962-9172501MLA BCT8373A SN54BCT8373A SN54BCT8373AFK SN54BCT8373AJT SN74BCT8373A SN74BCT8373ADW SN74BCT8373ADWE4 SN74BCT8373ADWRE4 
Vicor
Vicor
VI-2NTEY DC-DC Converters 50 to 200 Watts

Product Highlights
The VI-200 Family, with over 8 million shipped, is Vicor’s first generation of “zero-current switching” component-level DC-DC converters. Operating at frequencies up to 2 MHz, VI-200 Family Converters offer exceptional power density, efficiency, noise performance, reliability and ease of use. Power Boosters provide a simple, cost effective, off-the-shelf solution for higher
power output requirements. One or more boosters may be used to create


other parts : VI-200CU VI-200CV VI-200CW VI-200CX VI-200CY VI-200EU VI-200EV VI-200EW VI-200EX VI-200EY 
Vicor
Vicor
VI-JNTEZ MiniMod DC-DC Converters 25 to 100 Watts

Features
■Up to 50W/Cubic Inch
■UL, CSA, TÜV, VDE, BABT
■CE Marked
■Up to 90% Efficiency
■Size: 2.28" x 2.4" x 0.5" (57,9 x 61,0 x 12,7)
■Remote Sense and Current Limit
■Logic Disable
■Wide Range Output Adjust
■ZCS Power Architecture
■Low Noise FM Control


other parts : VI-J00 VI-J00-CW VI-J00-CW-F1 VI-J00-CW-F2 VI-J00-CW-S VI-JT3-EW VI-J00-CX VI-J00-CX-F1 VI-J00-CX-F2 VI-J00-CX-S 

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