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ISPLSI2096VE-100LT128 Datasheet - Lattice Semiconductor

ISPLSI2096VE-100LT128 Datasheet PDF Lattice Semiconductor

Part Name
ISPLSI2096VE-100LT128

Other PDF
  not available.

page
13 Pages

File Size
139.2 kB

MFG CO.
Lattice
Lattice Semiconductor Lattice

Description
The ispLSI 2096VE is a High Density Programmable Logic Device containing 96 Registers, six Dedicated Input pins, three Dedicated Clock Input pins, two dedicated Global OE input pins and a Global Routing Pool (GRP). The GRP provides complete interconnectivity between all of these elements. The ispLSI 2096VE features in-system programmability through the Boundary Scan Test Access Port (TAP) and is 100% IEEE 1149.1 Boundary Scan Testable. The ispLSI 2096VE offers non-volatile reprogrammability of the logic, as well as the interconnect to provide truly reconfigurable systems.

Features
• SuperFAST HIGH DENSITY PROGRAMMABLE LOGIC
    — 4000 PLD Gates
    — 96 I/O Pins, Six Dedicated Inputs
    — 96 Registers
    — High Speed Global Interconnect
    — Wide Input Gating for Fast Counters, State Machines, Address Decoders, etc.
    — Small Logic Block Size for Random Logic
    — 100% Functional, JEDEC and Pinout Compatible with ispLSI 2096V Devices
    — Pinout Compatible with ispLSI 2192VE
• 3.3V LOW VOLTAGE 2096 ARCHITECTURE
    — Interfaces with Standard 5V TTL Devices
• HIGH PERFORMANCE E2CMOS® TECHNOLOGY
    — fmax = 250MHz Maximum Operating Frequency
    — tpd = 4.0ns Propagation Delay
    — Electrically Erasable and Reprogrammable
    — Non-Volatile
    — 100% Tested at Time of Manufacture
    — Unused Product Term Shutdown Saves Power
• IN-SYSTEM PROGRAMMABLE
    — 3.3V In-System Programmability (ISP™) Using Boundary Scan Test Access Port (TAP)
    — Open-Drain Output Option for Flexible Bus Interface Capability, Allowing Easy Implementation of Wired-OR or Bus Arbitration Logic
    — Increased Manufacturing Yields, Reduced Time-toMarket and Improved Product Quality
    — Reprogram Soldered Devices for Faster Prototyping
• 100% IEEE 1149.1 BOUNDARY SCAN TESTABLE
• THE EASE OF USE AND FAST SYSTEM SPEED OF PLDs WITH THE DENSITY AND FLEXIBILITY OF FPGAS
    — Enhanced Pin Locking Capability
    — Three Dedicated Clock Input Pins
    — Synchronous and Asynchronous Clocks
    — Programmable Output Slew Rate Control
    — Flexible Pin Placement
    — Optimized Global Routing Pool Provides Global Interconnectivity
• LEAD-FREE PACKAGE OPTIONS

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