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5962F9670301VXC Datasheet - Intersil

Part Name
Description
MFG CO.
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Description
The Intersil ACS03MS is a Radiation Hardened quad 2-input NAND gate with open drain outputs. The open drain output can drive resistive loads from a separate supply voltage.

Features
• Devices QML Qualified in Accordance with MIL-PRF-38535
• Detailed Electrical and Screening Requirements are Contained in SMD# 5962-96703 and Intersil’s QM Plan
• 1.25 Micron Radiation Hardened SOS CMOS
• Total Dose . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . >300K RAD (Si)
• Single Event Upset (SEU) Immunity: <1 x 10-10 Errors/Bit/Day (Typ)
• SEU LET Threshold . . . . . . . . . . . . . . . . . . . . . . . >100 MEV-cm2/mg
• Dose Rate Upset . . . . . . . . . . . . . . . . >1011 RAD (Si)/s, 20ns Pulse
• Dose Rate Survivability. . . . . . . . . . . >1012 RAD (Si)/s, 20ns Pulse
• Latch-Up Free Under Any Conditions
• Military Temperature Range . . . . . . . . . . . . . . . . . . -55°C to +125°C
• Significant Power Reduction Compared to ALSTTL Logic
• DC Operating Voltage Range . . . . . . . . . . . . . . . . . . . . 4.5V to 5.5V
• Input Logic Levels
    - VIL = 30% of VCC Max
    - VIH = 70% of VCC Min
• Input Current ≤ 1µA at VOL, VOH
• Fast Propagation Delay . . . . . . . . . . . . . . . . 15ns (Max), 10ns (Typ)

Page Link's: 1  2  3  4 
 

Part Name
Description
PDF
MFG CO.
Radiation Hardened Quad 2-Input NAND Gate
Intersil
Radiation Hardened Quad 2-Input NAND Gate
Intersil
Radiation Hardened Quad 2-Input NAND Gate
Intersil
Radiation Hardened Quad 2-Input NAND Gate
Intersil
QUAD 2-INPUT OPEN DRAIN NAND GATE
STMicroelectronics
QUAD 2-INPUT OPEN DRAIN NAND GATE
STMicroelectronics
QUAD 2-INPUT OPEN DRAIN NAND GATE
STMicroelectronics
QUAD 2-INPUT OPEN DRAIN NAND GATE
STMicroelectronics
QUAD 2-INPUT OPEN DRAIN NAND GATE ( Rev : 2004 )
STMicroelectronics
Quad 2-input NAND gate (open drain)
Philips Electronics

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