AT91SAM9G46B-CU View Datasheet(PDF) - Atmel Corporation

Part Name

Description

Manufacturer

AT91SAM9G46B-CU

SMART ARM-based Embedded MPU

Atmel Corporation 

9. SAM9G46 Debug and Test

9.1 Description

The SAM9G46 features a number of complementary debug and test capabilities. A common JTAG/ICE (In-Circuit

Emulator) port is used for standard debugging functions, such as downloading code and single-stepping through

programs. The Debug Unit provides a two-pin UART that can be used to upload an application into internal SRAM.

It manages the interrupt handling of the internal COMMTX and COMMRX signals that trace the activity of the

Debug Communication Channel.

A set of dedicated debug and test input/output pins gives direct access to these capabilities from a PC-based test

environment.

9.2 Embedded Characteristics

 ARM926 Real-time In-circuit Emulator

̶ Two real-time Watchpoint Units

̶ Two Independent Registers: Debug Control Register and Debug Status Register

̶ Test Access Port Accessible through JTAG Protocol

̶ Debug Communications Channel

 Debug Unit

̶ Two-pin UART

̶ Debug Communication Channel Interrupt Handling

̶ Chip ID Register

 IEEE1149.1 JTAG Boundary-scan on All Digital Pins

52 SAM9G46 Series [DATASHEET]

Atmel-11028G-ATARM-SAM9G46-Datasheet_08-Dec-15

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