DatasheetQ Logo
Electronic component search and free download site. Transistors,MosFET ,Diode,Integrated circuits

AT91SAM9G46B-CU View Datasheet(PDF) - Atmel Corporation

Part Name
Description
Manufacturer
AT91SAM9G46B-CU
Atmel
Atmel Corporation 
AT91SAM9G46B-CU Datasheet PDF : 1277 Pages
First Prev 51 52 53 54 55 56 57 58 59 60 Next Last
The Debug Unit also manages the interrupt handling of the COMMTX and COMMRX signals that come from the
ICE and that trace the activity of the Debug Communication Channel.The Debug Unit allows blockage of access to
the system through the ICE interface.
A specific register, the Debug Unit Chip ID Register, gives information about the product version and its internal
configuration.
The SAM9G46 Debug Unit Chip ID value is 0x819B 05A2 and the extended ID is 0x00000004 on 32-bit width.
For further details on the Debug Unit, see Section 27. “Debug Unit (DBGU)”.
9.6.5
IEEE 1149.1 JTAG Boundary Scan
IEEE 1149.1 JTAG Boundary Scan allows pin-level access independent of the device packaging technology.
IEEE 1149.1 JTAG Boundary Scan is enabled when JTAGSEL is high. The SAMPLE, EXTEST and BYPASS
functions are implemented. In ICE debug mode, the ARM processor responds with a non-JTAG chip ID that
identifies the processor to the ICE system. This is not IEEE 1149.1 JTAG-compliant.
It is not possible to switch directly between JTAG and ICE operations. A chip reset must be performed after
JTAGSEL is changed.
A Boundary-scan Descriptor Language (BSDL) file is provided to set up test.
SAM9G46 Series [DATASHEET]
57
Atmel-11028G-ATARM-SAM9G46-Datasheet_08-Dec-15

Share Link: 

datasheetq.com  [ Privacy Policy ]Request Datasheet ] [ Contact Us ]