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CLP200M-TR(1998) View Datasheet(PDF) - STMicroelectronics

Part Name
Description
Manufacturer
CLP200M-TR
(Rev.:1998)
ST-Microelectronics
STMicroelectronics 
CLP200M-TR Datasheet PDF : 21 Pages
First Prev 11 12 13 14 15 16 17 18 19 20
CLP200M
Fig. 26 : Induction test behavior (Test 3b).
Fig. 28 : Powercontact test 3 (with R 10 series).
3.3.3 - Power contact test (Test 3 table 1/K20)
The test 3 of CCITT K20 requires a serial PTC (or
fuse) which is inserted in the test circuit to limit the
current rate. This PTC acts like an open-circuit af-
ter 60 ms when a surge occurs on the line. Mean-
while, the CLP200M has to withstand the surge.
The protection device CLP200M totally fulfills this
test.
Fig. 27 : Power contact test.
I
600 or < 10
V(RMS)
50Hz
PTC
15min
4Ω
Rsense
TIPL
TIPS
1/2 CLP200M
GND
I2
Rp
-48V
V
LCP1511D
SLIC
V2
12/21
®

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