CLP200M(1998) View Datasheet(PDF) - STMicroelectronics
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CLP200M Datasheet PDF : 21 Pages
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CLP200M
3. CLP200MTESTS RESULTS ACCORDING TO
CCITT K20 RECOMMENDATIONS
3.1 CCITT K20 Recommendations
In respect with the CCITT recommendations, the
CLP200M has to withstand three kinds of distur-
bances.
3.1.1. Lightning simulation
(Test 2, table 2/K20)
This test shall be done in transversaland longitudi-
nal modes as shown in figure 10.
Fig. 10 : Transversal and longitudinal test
topologies.
15
4kv
20µF
50
25
0.2µF
A or B
B or A
ITEM
UNDER
TEST
E
Fig. 11 : Power induction test circuit.
1µF
R1
S2
1µ F
100
S1 R2
A
ITEM
UNDER
TEST
BE
3.1.3. Power contact (Test 3, table 1/K20)
This test shall be done with the test circuit of figure
12.
Vac(max) = 220VRMS , with switch S in each posi-
tion and duration 15 min.
Fig. 12 : Power contact test circuit.
TRANSVERSAL TEST
25
15
25
A
ITEM
UNDER
B
TEST
4kv
20µF
50
0.2µF
E
LONGITUDINAL TEST
The test generator is the 10/700µs with 4kV of
peak voltage.
3.1.2. Power induction
(Test 3a and 3b, table 2/K20)
Two kinds of tests using the same circuit topology
(see fig.11) are defined in the CCITT K20.
Test 3a :
Vac(max) = 300VRMS, R1 = R2 = 600Ω
S2 operating and test duration = 200 ms.
Test 3b :
Vac(max) = 300VRMS (*), R1 = R2 = 200Ω
S2 operating and test duration not defined.
<10
600
A
ITEM
UNDER
<10
TEST
600
BE
3.1.4. Acceptance criteria and number of tests
For the tests described in chapter3.1.1., 3.1.2.and
3.1.3. two criteria are defined :
A: Equipment shall withstand the test without dam-
age and shall operate properly within the specified
limits.
B: A fire hazard should not occur in the equipment
as a result of the tests.
The criteria are affected to the different tests as
mentioned in the table 1.
(*) Recommended value.
8/21
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