LH28F160S5T-L80 View Datasheet(PDF) - Sharp Electronics

Part Name

Description

Manufacturer

LH28F160S5T-L80

16 M-bit (2 MB x 8/1 MB x 16) Smart 5 Flash Memories (Fast Programming)

Sharp Electronics 

LH28F160S5-L/S5H-L

6.2.2 AC INPUT/OUTPUT TEST CONDITIONS

3.0

INPUT

1.5

TEST POINTS

1.5 OUTPUT

0.0

AC test inputs are driven at 3.0 V for a Logic "1" and 0.0 V for a Logic "0". Input timing begins, and output

timing ends, at 1.5 V. Input rise and fall times (10% to 90%) < 10 ns.

Fig. 12 Transient Input/Output Reference Waveform for VCC = 5.0±0.25 V

(High Speed Testing Configuration)

2.4

INPUT

0.45

2.0

TEST POINTS

0.8

2.0

OUTPUT

0.8

AC test inputs are driven at VOH (2.4 VTTL) for a Logic "1" and VOL (0.45 VTTL) for a Logic "0". Input timing

begins at VIH (2.0 VTTL) and VIL (0.8 VTTL). Output timing ends at VIH and VIL. Input rise and fall times (10%

to 90%) < 10 ns.

Fig. 13 Transient Input/Output Reference Waveform for VCC = 5.0±0.5 V

(Standard Testing Configuration)

1.3 V

1N914

DEVICE

UNDER

TEST

CL Includes Jig

Capacitance

RL = 3.3 kΩ

OUT

CL

Test Configuration Capacitance Loading Value

TEST CONFIGURATION

VCC = 5.0±0.25 V (NOTE 1)

VCC = 5.0±0.5 V

CL (pF)

30

100

NOTE :

1. Applied to high-speed products, LH28F160S5-L70 and

LH28F160S5H-L70.

Fig. 14 Transient Equivalent Testing

Load Circuit

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