LH28F160S5-L/S5H-L
6.2.8 BLOCK ERASE, FULL CHIP ERASE, (MULTI) WORD/BYTE WRITE AND
BLOCK LOCK-BIT CONFIGURATION PERFORMANCE (NOTE 3, 4)
• VCC = 5.0±0.25 V, 5.0±0.5 V, TA = 0 to +70°C or –40 to +85°C
SYMBOL
PARAMETER
tWHQV1
tEHQV1
tWHQV1
tEHQV1
Word/Byte Write Time (using W/B write, in word mode)
Word/Byte Write Time (using W/B write, in byte mode)
NOTE
2
2
VCC = 5.0±0.5 V
MIN. TYP. (NOTE 1) MAX. UNIT
9.24
TBD µs
9.24
TBD µs
Word/Byte Write Time (using multi word/byte write)
2
Block Write Time (using W/B write, in word mode)
2
Block Write Time (using W/B write, in byte mode)
2
Block Write Time (using multi word/byte write)
2
tWHQV2
tEHQV2 Block Erase Time
2
2
TBD µs
0.31
3.7
s
0.61
7.5
s
0.13
1.5
s
0.34
10
s
tWHQV3
tEHQV3
tWHQV4
tEHQV4
tWHRH1
tEHRH1
tWHRH2
tEHRH2
Full Chip Erase Time
Set Block Lock-Bit Time
Clear Block Lock-Bits Time
Write Suspend Latency Time to Read
Erase Suspend Latency Time to Read
10.9
TBD
s
2
9.24
TBD µs
2
0.34
TBD
s
5.6
7
µs
9.4
13.1 µs
NOTES :
1. Typical values measured at TA = +25°C and nominal
voltages. Assumes corresponding block lock-bits are not
set. Subject to change based on device characterization.
2. Excludes system-level overhead.
3. These performance numbers are valid for all speed
versions.
4. Sampled, not 100% tested.
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