STM32F205VE View Datasheet(PDF) - STMicroelectronics
Part Name
Description
Manufacturer
STM32F205VE Datasheet PDF : 177 Pages
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STM32F20xxx
Electrical characteristics
5.3.8
External clock source characteristics
High-speed external user clock generated from an external source
The characteristics given in Table 26 result from tests performed using an high-speed
external clock source, and under ambient temperature and supply voltage conditions
summarized in Table 12.
Table 26. High-speed external user clock characteristics
Symbol
Parameter
Conditions Min Typ Max Unit
fHSE_ext
External user clock source
frequency(1)
1
-
26 MHz
VHSEH
VHSEL
OSC_IN input pin high level voltage
OSC_IN input pin low level voltage
0.7VDD -
VDD
V
VSS
- 0.3VDD
tw(HSE)
tw(HSE)
tr(HSE)
tf(HSE)
Cin(HSE)
OSC_IN high or low time(1)
OSC_IN rise or fall time(1)
OSC_IN input capacitance(1)
5
-
-
ns
-
-
20
-
5
-
pF
DuCy(HSE) Duty cycle
45
-
55
%
IL
OSC_IN Input leakage current
VSS ≤ VIN ≤ VDD
-
-
±1 µA
1. Guaranteed by design, not tested in production.
Low-speed external user clock generated from an external source
The characteristics given in Table 27 result from tests performed using an low-speed
external clock source, and under ambient temperature and supply voltage conditions
summarized in Table 12.
Table 27. Low-speed external user clock characteristics
Symbol
Parameter
Conditions
Min Typ Max Unit
fLSE_ext
User External clock source
frequency(1)
-
32.768 1000 kHz
VLSEH
VLSEL
OSC32_IN input pin high level
voltage
OSC32_IN input pin low level
voltage
0.7VDD
-
VDD
V
VSS
-
0.3VDD
tw(LSE)
tf(LSE)
tr(LSE)
tf(LSE)
Cin(LSE)
OSC32_IN high or low time(1)
OSC32_IN rise or fall time(1)
OSC32_IN input capacitance(1)
450
-
-
ns
-
-
50
-
5
-
pF
DuCy(LSE) Duty cycle
30
-
70
%
IL
OSC32_IN Input leakage current VSS ≤ VIN ≤ VDD
-
-
±1
µA
1. Guaranteed by design, not tested in production.
Doc ID 15818 Rev 9
81/177
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