AD5200 View Datasheet(PDF) - Analog Devices

Part Name

Description

Manufacturer

AD5200

256-Position and 33-Position Digital Potentiometers

Analog Devices 

AD5200/AD5201

TEST CIRCUITS

Figures 6 to 14 define the test conditions used in the product

specification table.

DUT

A

V+ = VDD

1 LSB = V+/2N

V+

W

B

VMS

Figure 6. Potentiometer Divider Nonlinearity Error Test

Circuit (INL, DNL)

NO CONNECT

DUT

A

W

B

IW

VMS

Figure 7. Resistor Position Nonlinearity Error

(Rheostat Operation; R-INL, R-DNL)

VMS2

DUT

A

W

B

IW = VDD/RNOMINAL

VW

VMS1

RW = [VMS1 – VMS2]/IW

Figure 8. Wiper Resistance Test Circuit

VA

VDD A

V+

W

V+ = VDD ؎10%

B

PSRR (dB) = 20 LOG

⌬VMS

⌬VDD

VMS

PSS (%/%) = ⌬VMS%

⌬VDD%

Figure 9. Power Supply Sensitivity Test Circuit

(PSS, PSRR)

A DUT B

VIN

OFFSET

GND

5V

W

OP279

OFFSET BIAS

VOUT

Figure 10. Inverting Gain Test Circuit

5V

OP279

VIN

W

OFFSET

GND

A DUT B

OFFSET BIAS

VOUT

Figure 11. Noninverting Gain Test Circuit

VIN

OFFSET

GND

A

W

B

2.5V

+15V

OP42

–15V

VOUT

Figure 12. Gain vs. Frequency Test Circuit

DUT

W

B

RSW =

0.1V

ISW

CODE = OOH

+

ISW

0.1V

–

VSS TO VDD

Figure 13. Incremental ON Resistance Test Circuit

NC

VDD

DUT

VSS GND

A

W

B

ICM

VCM

NC

NC = NO CONNECT

Figure 14. Common-Mode Leakage Current Test Circuit

–14–

REV. B

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