AT87C54X2-3CSUL View Datasheet(PDF) - Atmel Corporation
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Description
Manufacturer
AT87C54X2-3CSUL Datasheet PDF : 62 Pages
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AT/TS8xC54/8X2
5. Typicals are based on a limited number of samples and are not guaranteed. The values listed are at room temper-
ature and 5V.
6. Under steady state (non-transient) conditions, IOL must be externally limited as follows:
Maximum IOL per port pin: 10 mA
Maximum IOL per 8-bit port:
Port 0: 26 mA
Ports 1, 2 and 3: 15 mA
Maximum total IOL for all output pins: 71 mA
If IOL exceeds the test condition, VOL may exceed the related specification. Pins are not guaranteed to sink current
greater than the listed test conditions.
7. For other values, please contact your sales office.
8. Operating ICC is measured with all output pins disconnected; XTAL1 driven with TCLCH, TCHCL = 5 ns (see Figure
19-5.), VIL = VSS + 0.5 V,
VIH = VCC - 0.5V; XTAL2 N.C.; EA = Port 0 = VCC; RST = VSS. The internal ROM runs the code 80 FE (label: SJMP
label). ICC would be slightly higher if a crystal oscillator is used. Measurements are made with OTP products when
possible, which is the worst case.
Figure 19-1. ICC Test Condition, under reset
VCC
ICC
VCC
VCC
P0
VCC
RST EA
(NC)
CLOCK
SIGNAL
XTAL2
XTAL1
VSS
All other pins are disconnected.
Figure 19-2. Operating ICC Test Condition
Reset = Vss after a high pulse
during at least 24 clock cycles
VCC
ICC
VCC
VCC
P0
RST EA
(NC)
CLOCK
SIGNAL
XTAL2
XTAL1
VSS
All other pins are disconnected.
45
4431E–8051–04/06
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