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C8051F002 View Datasheet(PDF) - Silicon Laboratories

Part Name
Description
Manufacturer
C8051F002
Silabs
Silicon Laboratories 
C8051F002 Datasheet PDF : 171 Pages
First Prev 161 162 163 164 165 166 167 168 169 170
C8051F000/1/2/5/6/7
C8051F010/1/2/5/6/7
21.1.1. EXTEST Instruction
The EXTEST instruction is accessed via the IR. The Boundary DR provides control and observability of all the
device pins as well as the SFR bus and Weak Pullup feature. All inputs to on-chip logic are set to one.
21.1.2. SAMPLE Instruction
The SAMPLE instruction is accessed via the IR. The Boundary DR provides observability and presetting of the
scan-path latches.
21.1.3. BYPASS Instruction
The BYPASS instruction is accessed via the IR. It provides access to the standard 1-bit JTAG Bypass data register.
21.1.4. IDCODE Instruction
The IDCODE instruction is accessed via the IR. It provides access to the 32-bit Device ID register.
Figure 21.2. DEVICEID: JTAG Device ID Register
Version
Bit31
Bit28 Bit27
Part Number
Bit12 Bit11
Manufacturer ID
Reset Value
1
(Varies)
Bit1 Bit0
Version = 0000b (Revision A) or
= 0001b (Revision B)
Part Number = 0000 0000 0000 0000b or
= 0000 0000 0000 0010b
Manufacturer ID = 0010 0100 001b (Silicon Laboratories)
Rev. 1.7
166

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