CS5101A CS5102A
Figure 17. CS5101A DNL Error Distribution
Figure 18. CS5102A DNL Error Distribution
7.2 FFT Tests and Windowing
In the factory, the CS5101A and CS5102A are
tested using Fast Fourier Transform (FFT) tech-
niques to analyze the converters' dynamic perfor-
mance. A pure sine wave is applied to the device,
and a “time record” of 1024 samples is captured
and processed. The FFT algorithm analyzes the
spectral content of the digital waveform and distrib-
utes its energy among 512 “frequency bins.” As-
suming an ideal sine wave, distribution of energy in
bins outside of the fundamental and DC can only
be due to quantization effects and errors in the
CS5101A and CS5102A.
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DS45F6