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M29F800DB55M1(2003) View Datasheet(PDF) - STMicroelectronics

Part Name
Description
Manufacturer
M29F800DB55M1
(Rev.:2003)
ST-Microelectronics
STMicroelectronics 
M29F800DB55M1 Datasheet PDF : 39 Pages
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M29F800DT, M29F800DB
Table 23. CFI Query System Interface Information
Address
x16
x8
Data
Description
VCC Logic Supply Minimum Program/Erase voltage
1Bh
36h
0045h
bit 7 to 4
BCD value in volts
bit 3 to 0
BCD value in 100 mV
VCC Logic Supply Maximum Program/Erase voltage
1Ch
38h
0055h
bit 7 to 4
BCD value in volts
bit 3 to 0
BCD value in 100 mV
1Dh
3Ah
0000h VPP [Programming] Supply Minimum Program/Erase voltage
1Eh
3Ch
0000h VPP [Programming] Supply Maximum Program/Erase voltage
1Fh
3Eh
0004h Typical timeout per single byte/word program = 2n µs
20h
40h
0000h Typical timeout for minimum size write buffer program = 2n µs
21h
42h
000Ah Typical timeout per individual block erase = 2n ms
22h
44h
0000h Typical timeout for full chip erase = 2n ms
23h
46h
0004h Maximum timeout for byte/word program = 2n times typical
24h
48h
0000h Maximum timeout for write buffer program = 2n times typical
25h
4Ah
0003h Maximum timeout per individual block erase = 2n times typical
26h
4Ch
0000h Maximum timeout for chip erase = 2n times typical
Note: 1. Not supported in the CFI
Value
4.5V
5.5V
NA
NA
16µs
NA
1s
see note (1)
256µs
NA
8s
see note (1)
30/39

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