M29W640FT, M29W640FB
4 Command Interface
Table 7. Program, Erase Times and Program, Erase Endurance Cycles
Parameter
Min
Typ(1) (2)
Max(2)
Unit
Chip Erase
Block Erase (64 KBytes)
Erase Suspend Latency Time
Program (Byte or Word)
Double Byte
Double Word /Quadruple Byte Program
Quadruple Word / Octuple Byte Program
Chip Program (Byte by Byte)
Chip Program (Word by Word)
Chip Program (Double Word/Quadruple Byte Program)
Chip Program (Quadruple Word/Octuple Byte Program)
Program Suspend Latency Time
Program/Erase Cycles (per Block)
Data Retention
80
0.8
10
10
10
10
80
40
20
10
100,000
20
400(3)
6(4)
50(4)
200(3)
200(3)
200(3)
200(3)
400(3)
200(3)
100(3)
50(3)
4
s
s
µs
µs
µs
µs
µs
s
s
s
s
µs
cycles
years
1. Typical values measured at room temperature and nominal voltages.
2. Sampled, but not 100% tested.
3. Maximum value measured at worst case conditions for both temperature and VCC after 100,00 program/erase cycles.
4. Maximum value measured at worst case conditions for both temperature and VCC.
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