MCP4014-502E/CH View Datasheet(PDF) - Microchip Technology
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MCP4014-502E/CH Datasheet PDF : 60 Pages
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6.3 Operational Characteristics
Understanding the operational characteristics of the
device’s resistor components is important to the system
design.
6.3.1 ACCURACY
6.3.1.1 Integral Non-Linearity (INL)
INL error for these devices is the maximum deviation
between an actual code transition point and its
corresponding ideal transition point after offset and
gain errors have been removed. These endpoints are
from 0x00 to 0x3F. Refer to Figure 6-5.
Positive INL means higher resistance than ideal.
Negative INL means lower resistance than ideal.
INL < 0
111
Actual
110 Rransfer
Function
101
Digital 100
Input
Code 011
010
Ideal Transfer
Function
001
000
INL < 0
Digital Pot Output
FIGURE 6-5:
INL Accuracy.
MCP4011/2/3/4
6.3.1.2 Differential Non-Linearity (DNL)
DNL error is the measure of variations in code widths
from the ideal code width. A DNL error of zero would
imply that every code is exactly 1 LSb wide.
111
110 Actual
Transfer
101 Function
Digital 100
Input
Code 011
010
001
000
Ideal Transfer
Function
Wide Code, > 1 LSb
Narrow Code < 1 LSb
Digital Pot Output
FIGURE 6-6:
DNL Accuracy.
6.3.1.3 Ratiometric Temperature Coefficient
The ratiometric temperature coefficient quantifies the
error in the ratio RAW/RWB due to temperature drift.
This is typically the critical error when using a
potentiometer device (MCP4011 and MCP4013) in a
voltage divider configuration.
6.3.1.4 Absolute Temperature Coefficient
The absolute temperature coefficient quantifies the
error in the end-to-end resistance (nominal resistance
RAB) due to temperature drift. This is typically the
critical error when using a rheostat device (MCP4012
and MCP4014) in an adjustable resistor configuration.
© 2006 Microchip Technology Inc.
DS21978C-page 41
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