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PIC16LF777T-I/SP View Datasheet(PDF) - Microchip Technology

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PIC16LF777T-I/SP Datasheet PDF : 276 Pages
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PIC16F7X7
18.4 DC Characteristics: PIC16F737/747/767/777 (Industrial, Extended)
PIC16LF737/747/767/777 (Industrial) (Continued)
DC CHARACTERISTICS
Standard Operating Conditions (unless otherwise stated)
Operating temperature -40°C TA +85°C for industrial
-40°C TA +125°C for extended
Operating voltage VDD range as described in
Section 18.1 “DC Characteristics”.
Param
No.
Sym
Characteristic
Min
Typ† Max Units
Conditions
IIL Input Leakage Current(2, 3)
D060
I/O ports
±1
µA VSS VPIN VDD,
pin at high-impedance
D061
MCLR, RA4/T0CKI
±5
µA VSS VPIN VDD
D063
OSC1
±5
µA VSS VPIN VDD,
XT, HS and LP oscillator
configuration
VOL Output Low Voltage
D080
I/O ports
0.6
V IOL = 8.5 mA, VDD = 4.5V,
-40°C to +125°C
D083
OSC2/CLKO
(RC oscillator configuration)
0.6
V IOL = 1.6 mA, VDD = 4.5V,
-40°C to +125°C
0.6
V IOL = 1.2 mA, VDD = 4.5V,
-40°C to +125°C
VOH Output High Voltage
D090
I/O ports (Note 3)
VDD – 0.7
V IOH = -3.0 mA, VDD = 4.5V,
-40°C to +125°C
D092
OSC2/CLKO
(RC oscillator configuration)
VDD – 0.7
V IOH = -1.3 mA, VDD = 4.5V,
-40°C to +125°C
VDD – 0.7
V IOH = -1.0 mA, VDD = 4.5V,
-40°C to +125°C
D150* VOD Open-Drain High Voltage
12
V RA4 pin
Capacitive Loading Specs
on Output Pins
D100 COSC2 OSC2 pin
15 pF In XT, HS and LP modes
when external clock is used
to drive OSC1
D101 CIO
D102 CB
All I/O pins and OSC2
(in RC mode)
SCL, SDA in I2C™ mode
50 pF
— 400 pF
Program Flash Memory
D130 EP Endurance
100
1000 — E/W 25°C at 5V
D131 VPR VDD for Read
2.0
5.5
V
* These parameters are characterized but not tested.
† Data in “Typ” column is at 5V, 25°C unless otherwise stated. These parameters are for design guidance
only and are not tested.
Note 1: In RC oscillator configuration, the OSC1/CLKI pin is a Schmitt Trigger input. It is not recommended that the
PIC16F7X7 be driven with external clock in RC mode.
2: The leakage current on the MCLR pin is strongly dependent on the applied voltage level. The specified
levels represent normal operating conditions. Higher leakage current may be measured at different input
voltages.
3: Negative current is defined as current sourced by the pin.
2004 Microchip Technology Inc.
DS30498C-page 219

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