PIC18F24K20-I/SO View Datasheet(PDF) - Microchip Technology

Part Name

Description

Manufacturer

PIC18F24K20-I/SO

28/40/44-Pin Flash Microcontrollers with nanoWatt XLP Technology

Microchip Technology 

PIC18F2XK20/4XK20

26.9 DC Characteristics: Input/Output Characteristics, PIC18F2XK20/4XK20

DC CHARACTERISTICS

Standard Operating Conditions (unless otherwise stated)

Operating temperature -40°C TA  +125°C

Param

No.

Symbol

Characteristic

Min

Typ†

Max Units Conditions

VIL

Input Low Voltage

I/O ports:

D030

with TTL buffer

VSS

—

0.15 VDD V

D031

with Schmitt Trigger

VSS

—

0.2 VDD V

D032

MCLR

VSS

—

0.2 VDD V

D033

D033A

D033B

D034

OSC1

OSC1

OSC1

T13CKI

VSS

—

0.3 VDD V HS, HSPLL modes

VSS

—

0.2 VDD V RC, EC modes(1)

VSS

—

0.3 VDD V XT, LP modes

VSS

—

0.3 VDD V

VIH Input High Voltage

I/O ports:

D040

with TTL buffer

0.25 VDD + 0.8V

—

VDD

V

D041 VIH

with Schmitt Trigger:

0.8 VDD

—

VDD

V 2.4V < VDD < 3.6V

0.9 VDD

—

VDD

V VDD < 2.4V

D042 VIH

MCLR

0.8 VDD

—

VDD

V 2.4V < VDD < 3.6V

0.9 VDD

—

VDD

V VDD < 2.4V

D043

OSC1

0.7 VDD

—

VDD

V HS, HSPLL modes

D043A

D043B

D043C

D044

OSC1

OSC1

OSC1

T13CKI

0.8 VDD

—

VDD

V EC mode

0.9 VDD

—

VDD

V RC mode(1)

1.6

—

VDD

V XT, LP modes

1.6

—

VDD

V

IIL

Input Leakage I/O and

MCLR(2,3)

VSS VPIN VDD,

Pin at

high-impedance

D060

I/O ports

—

—

—

—

Input Leakage RA2

D061 IIL

—

—

—

—

Input Leakage RA3

D062 IIL

—

—

—

—

5

50

nA +25°C

10

100

nA +60°C

30

200

nA +85°C

100

1000 nA +125°C

10

100

nA +25°C

35

250

nA +60°C

200

750

nA +85°C

400

2000 nA +125°C

10

80

nA +25°C

25

200

nA +60°C

70

500

nA +85°C

300

1500 nA +125°C

Note 1:

2:

3:

4:

In RC oscillator configuration, the OSC1/CLKIN pin is a Schmitt Trigger input. It is not recommended that

the PIC® device be driven with an external clock while in RC mode.

The leakage current on the MCLR pin is strongly dependent on the applied voltage level. The specified

levels represent normal operating conditions. Higher leakage current may be measured at different input

voltages.

Negative current is defined as current sourced by the pin.

Parameter is characterized but not tested.

 2010 Microchip Technology Inc.

DS41303G-page 377

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