SI3232-X-FQR View Datasheet(PDF) - Silicon Laboratories

Part Name

Description

Manufacturer

SI3232-X-FQR

DUAL PROGRAMMABLE CMOS SLIC WITH LINE MONITORING

Silicon Laboratories 

Si3232

Table 6. Monitor ADC Characteristics

(VDD, VDD1–VDD4 = 3.13 to 3.47 V, TA = 0 to 70 °C for K-Grade, –40 to 85 °C for B-Grade)

Parameter

Symbol

Test Condition

Min

Typ

Max

Unit

Resolution

—

8

—

Bits

Differential Nonlinearity

DNL

—

±0.75

—

LSB

–1.0

—

+1.5

LSB

Integral Nonlinearity

INL

—

±0.6

±1.5

LSB

Gain Error

—

±0.1

±0.25 LSB

Table 7. Si3200 Characteristics

(VDD = 3.13 to 3.47 V, TA = 0 to 70 °C for K-Grade, –40 to 85 °C for B-Grade)

Parameter

Symbol

Test Condition

Min

TIP/RING Pulldown Transistor

VCM

Saturation Voltage

TIP/RING Pullup Transistor

VOV

Saturation Voltage

Battery Switch Saturation

Impedance

RSAT

OPEN State TIP/RING Leakage

ILKG

Current

Internal Blocking Diode Forward

VF

Voltage

Notes:

1. VAC = 2.5 VPK, RLOAD = 600 Ω.

2. IOUT = 60 mA

VRING – VBAT (Forward),

VTIP – VBAT (Reverse)

ILIM = 22 mA, IABIAS = 4 mA1

⎯

ILIM = 45 mA, IABIAS = 16 mA1 ⎯

GND – VTIP (Forward)

GND – VRING (Reverse)

ILIM = 22 mA1

⎯

ILIM = 45 mA1

⎯

(VBAT – VBATH)/IOUT (Note 2)

⎯

RL = 0 Ω

⎯

VBAT – VBATL (Note 2)

⎯

Typ Max

3⎯

4—

3⎯

4—

15 ⎯

⎯ 100

0.8 ⎯

Unit

V

V

V

V

W

µA

V

Preliminary Rev. 0.96

11

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