Si3233
Pin #
28
29
30
31
32
33
34
Name
Description
TEST1
Test.
Enables test modes for Silicon Labs internal testing. This pin should always be tied to
ground for normal operation.
DCFF DC Feed-Forward/High Current General Purpose Output.
Feed-forward drive of external bipolar transistors to improve dc-dc converter efficiency.
DCDRV DC Drive/Battery Switch.
DC-DC converter control signal output which drives external bipolar transistor. Battery
switch control signal output which drives external bipolar transistor.
SDITHRU SDI Passthrough.
Cascaded SDI output signal for daisy-chain mode.
SDO
Serial Port Data Out.
Serial port control data output.
SDI Serial Port Data In.
Serial port control data input.
SCLK Serial Port Bit Clock Input.
Serial port clock input. Controls the serial data on SDO and latches the data on SDI.
Preliminary Rev. 0.5
93