SST29SF040-70-4C-NHE View Datasheet(PDF) - Silicon Storage Technology
Part Name
Description
Manufacturer
SST29SF040-70-4C-NHE Datasheet PDF : 25 Pages
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Data Sheet
2 Mbit / 4 Mbit Small-Sector Flash
SST29SF020 / SST29SF040
SST29VF020 / SST29VF040
VIHT
INPUT
VIT
REFERENCE POINTS
VOT
OUTPUT
VILT
1160 F12.0
AC test inputs are driven at VIHT (3.0V) for a logic “1” and VILT (0V) for a logic “0”. Measurement reference points for inputs
and outputs are VIT (1.5 VDD) and VOT (1.5 VDD). Input rise and fall times (10% ↔ 90%) are <10 ns.
FIGURE 13: AC Input/Output Reference Waveforms for SST29SF020/040
Note: VIT - VINPUT Test
VOT - VOUTPUT Test
VIHT - VINPUT HIGH Test
VILT - VINPUT LOW Test
VIHT
INPUT
VIT
REFERENCE POINTS
VOT
OUTPUT
VILT
1160 F12.0
AC test inputs are driven at VIHT (0.9 VDD) for a logic “1” and VILT (0.1 VDD) for a logic “0”. Measurement reference points
for inputs and outputs are VIT (0.5 VDD) and VOT (0.5 VDD). Input rise and fall times (10% ↔ 90%) are <5 ns.
FIGURE 14: AC Input/Output Reference Waveforms for SST29VF020/040
Note: VIT - VINPUT Test
VOT - VOUTPUT Test
VIHT - VINPUT HIGH Test
VILT - VINPUT LOW Test
TO DUT
SST29SF040
TO TESTER
CL
RL LOW
FIGURE 15: Test Load Examples
VDD
RL HIGH
1160 F14a.0
SST29VF040
TO TESTER
TO DUT
CL
1160 F14b.0
©2005 Silicon Storage Technology, Inc.
16
S71160-13-000
10/06
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