ST72334J4B7(2003) View Datasheet(PDF) - STMicroelectronics

Part Name

Description

Manufacturer

ST72334J4B7
(Rev.:2003)

8-BIT MCU WITH SINGLE VOLTAGE FLASH MEMORY, ADC, 16-BIT TIMERS, SPI, SCI INTERFACES

STMicroelectronics 

ST72334J/N, ST72314J/N, ST72124J

OPERATING CONDITIONS (Cont’d)

16.3.2 Operating Conditions with Low Voltage Detector (LVD)

Subject to general operating conditions for VDD, fOSC, and TA.

Symbol

VIT+

VIT-

Vhys

VtPOR

tg(VDD)

Parameter

Conditions

Reset release threshold (VDD rise)

High Threshold

Med. Threshold

Low Threshold

High Threshold

Reset generation threshold (VDD fall) Med. Threshold

Low Threshold4)

LVD voltage threshold hysteresis

VDD rise time rate 3)

Filtered glitch delay on VDD 2)

VIT+-VIT-

Not detected by the LVD

Min

4.10 2)

3.75 2)

3.25 2)

3.852)

3.502)

3.00

200

0.2

Typ 1)

4.30

3.90

3.35

4.05

3.65

3.10

250

Max

4.50

4.05

3.55

4.30

3.95

3.35

300

50

40

Unit

V

mV

V/ms

ns

Figure 57. High LVD Threshold Versus VDD and fOSC for FLASH devices 3)

FUNCTIONALITY AND RESET NOT GUARANTEED IN THIS AREA

DEVICE UNDER

RESET

IN THIS AREA

fOSC [MHz]

0 0 0 16

0 0 0 12

000 000 0008

00000

00000

00000

00000

00000

00000

00000

00000

00000

00000

00000

00000

00000

00000

00000

00000

FOR

00000 00000 00000 00000 00000

TEMPERATURES

00000 00000 00000 00000 00000 00000 00000

HIGHER

THAN

85°C

FUNCTIONALITY

NOT GUARANTEED

IN THIS AREA

FUNCTIONAL AREA

0

2.5

3

3.5 VIT-≥3.85 4

4.5

5

SUPPLY VOLTAGE [V]

5.5

Figure 58. Medium LVD Threshold Versus VDD and fOSC for FLASH devices 3)

FUNCTIONALITY AND RESET NOT GUARANTEED IN THIS AREA

fOSC [MHz]

FOR TEMPERATURES HIGHER THAN 85°C

DEVICE UNDER

RESET

IN THIS AREA

16

12

8

0000

0000

0000

0000

0000

0000

0000

0000

0000

0000

0000

0000

0000

0000

0000

0000

0000

0000

0000

0000

0000

0000

0000

FUNCTIONALITY

NOT GUARANTEED

IN THIS AREA

FUNCTIONAL AREA

0

SUPPLY VOLTAGE [V]

2.5

3

VIT-≥3.5V

4

4.5

5

5.5

Figure 59. Low LVD Threshold Versus VDD and fOSC for FLASH devices 2)4)

fOSC [MHz]

FUNCTIONALITY NOT GUARANTEED IN THIS AREA

FOR TEMPERATURES HIGHER THAN 85°C

16

DEVICE UNDER

RESET

IN THIS AREA

12

8

0

000

000

000

000

000

000

000

000

000

000

000

000

SEE NOTE 4

2.5

VIT-≥3V 3.2 3.5

4

4.5

5

FUNCTIONALITY

NOT GUARANTEED

IN THIS AREA

FUNCTIONAL AREA

SUPPLY VOLTAGE [V]

5.5

Notes:

1. LVD typical data are based on TA=25°C. They are given only as design guidelines and are not tested.

2. Data based on characterization results, not tested in production.

3. The VDD rise time rate condition is needed to insure a correct device power-on and LVD reset. Not tested in production.

4.If the low LVD threshold is selected, when VDD falls below 3.2V, (VDD minimum operating voltage), the device is guar-

anteed to continue functioning until it goes into reset state. The specified VDD min. value is necessary in the device power

on phase, but during a power down phase or voltage drop the device will function below this min. level.

111/153

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