AS29F200B-55TI View Datasheet(PDF) - Alliance Semiconductor
Part Name
Description
Manufacturer
AS29F200B-55TI Datasheet PDF : 20 Pages
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Device under Test
100 pF*
VSS
*including scope
and jig capacitance
Test condition
-170 -200 Unit
Output load
1 TTL gate
Input rise and fall times
5
ns
Input pulse levels
0.0-2.0
V
Input timing measurement reference levels
1.0
V
Output timing measurement reference levels
1.0
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Parameter
Supply voltage
Input voltage
Symbol
VCC
VSS
VIH
VIL
Min
+4.5
0
2.0
–0.5
Typical
5.0
0
-
-
Max
Unit
+5.5
V
0
V
VCC + 0.5 V
0.8
V
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Parameter
Symbol
Min
Max
Unit
Input voltage (Input or DQ pin)
VIN
–2.0
+7.0
V
Input Voltage (A9 pin, OE, RESET)
VIN
–2.0
+13.0
V
Power supply voltage
VCC
-0.5
+5.5
V
Operating temperature
TOPR
–55
+125
°C
Storage temperature (Plastic)
TSTG
–65
+150
°C
Short circuit output current
IOUT
-
200
mA
Stresses greater than those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only and functional operation
of the device at these or any other conditions outside those indicated in the operational sections of this specification is notimplied. Exposure to absolute max-
imum rating conditions for extended periods may affect reliability.
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Parameter
Input voltage with respect to VSS on A9, OE, and RESET pin
Input voltage with respect to VSS on all DQ, address and control pins
Current
Includes all pins except VCC. Test conditions: VCC = 5.0V, one pin at a time.
Min
Max
Unit
-1.0
+13.0 V
-1.0
VCC+1.0 V
-100
+100 mA
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