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STM32F051X8 View Datasheet(PDF) - STMicroelectronics

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Description
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STM32F051X8 Datasheet PDF : 122 Pages
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STM32F051x4 STM32F051x6 STM32F051x8
Electrical characteristics
Table 55. DAC characteristics (continued)
Symbol
Parameter
Min Typ
Max
Unit
Comments
Gain error(3) Gain error
-
-
±0.5
%
Given for the DAC in 12-bit
configuration
Settling time (full scale: for a
10-bit input code transition
tSETTLING(3)
between the lowest and the
highest input codes when
-
3
DAC_OUT reaches final
value ±1LSB
4
µs CLOAD 50 pF, RLOAD 5 k
Max frequency for a correct
Update
rate(3)
DAC_OUT change when
small variation in the input
-
-
code (from code i to i+1LSB)
1
MS/s CLOAD 50 pF, RLOAD 5 k
Wakeup time from off state
tWAKEUP(3) (Setting the ENx bit in the
-
6.5
10
CLOAD 50 pF, RLOAD 5 k
µs input code between lowest and
DAC Control register)
highest possible ones.
Power supply rejection ratio
PSRR+ (1) (to VDDA) (static DC
- –67
–40
dB No RLOAD, CLOAD = 50 pF
measurement
1. Guaranteed by design, not tested in production.
2. The DAC is in “quiescent mode” when it keeps the value steady on the output so no dynamic consumption is involved.
3. Data based on characterization results, not tested in production.
Figure 27. 12-bit buffered / non-buffered DAC
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1. The DAC integrates an output buffer that can be used to reduce the output impedance and to drive external
loads directly without the use of an external operational amplifier. The buffer can be bypassed by
configuring the BOFFx bit in the DAC_CR register.
DocID022265 Rev 7
81/122
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