STM8S105K6U3C View Datasheet(PDF) - STMicroelectronics

Part Name

Description

Manufacturer

STM8S105K6U3C

Access line, 16 MHz STM8S 8-bit MCU, up to 32 Kbytes Flash, integrated EEPROM,10-bit ADC, timers, UART, SPI, I²C

STMicroelectronics 

Electrical characteristics

STM8S105xx

10.3.12.4 Absolute maximum ratings (electrical sensitivity)

Based on two different tests (ESD and LU) using specific measurement methods, the product

is stressed in order to determine its performance in terms of electrical sensitivity. For more

details, refer to the application note AN1181.

10.3.12.5 Electrostatic discharge (ESD)

Electrostatic discharges (3 positive then 3 negative pulses separated by 1 second) are applied

to the pins of each sample according to each pin combination. The sample size depends on

the number of supply pins in the device (3 parts*(n+1) supply pin). This test conforms to the

JESD22-A114A/A115A standard. For more details, refer to the application note AN1181.

Table 50: ESD absolute maximum ratings

Symbol Ratings

Conditions

Class Maximum Unit

value(1)

VESD(HBM) Electrostatic discharge

TA = +25°C,

voltage (Human body model) conforming to

JESD22-A114

A 2000

V

VESD(CDM) Electrostatic discharge

voltage (Charge device

model)

TA=+25°C, conforming IV 1000

V

to JESD22-C101

(1) Data based on characterization results, not tested in production

10.3.12.6 Static latch-up

Two complementary static tests are required on 10 parts to assess the latch-up performance:

• A supply overvoltage (applied to each power supply pin)

• A current injection (applied to each input, output and configurable I/O pin) are performed

on each sample.

This test conforms to the EIA/JESD 78 IC latch-up standard. For more details, refer to the

application note AN1181.

Table 51: Electrical sensitivities

Symbol Parameter

Conditions

Class(1)

LU

Static latch-up class

TA = +25 °C

A

TA = +85 °C

A

TA = +125 °C

A

104/127

DocID14771 Rev 9

Share Link: