STM32F100C6T7B View Datasheet(PDF) - STMicroelectronics

Part Name

Description

Manufacturer

STM32F100C6T7B

Low & medium-density value line, advanced ARM®-based 32-bit MCU with 16 to 128 KB Flash, 12 timers, ADC, DAC & 8 comm interfaces

STMicroelectronics 

STM32F100x4, STM32F100x6, STM32F100x8, STM32F100xB

Description

2.2.23

2.2.24

2.2.25

DAC (digital-to-analog converter)

The two 12-bit buffered DAC channels can be used to convert two digital signals into two

analog voltage signal outputs. The chosen design structure is composed of integrated

resistor strings and an amplifier in noninverting configuration.

This dual digital Interface supports the following features:

• two DAC converters: one for each output channel

• up to 10-bit output

• left or right data alignment in 12-bit mode

• synchronized update capability

• noise-wave generation

• triangular-wave generation

• dual DAC channels’ independent or simultaneous conversions

• DMA capability for each channel

• external triggers for conversion

• input voltage reference VREF+

Eight DAC trigger inputs are used in the STM32F100xx. The DAC channels are triggered

through the timer update outputs that are also connected to different DMA channels.

Temperature sensor

The temperature sensor has to generate a voltage that varies linearly with temperature. The

conversion range is between 2 V < VDDA < 3.6 V. The temperature sensor is internally

connected to the ADC1_IN16 input channel which is used to convert the sensor output

voltage into a digital value.

Serial wire JTAG debug port (SWJ-DP)

The ARM SWJ-DP Interface is embedded, and is a combined JTAG and serial wire debug

port that enables either a serial wire debug or a JTAG probe to be connected to the target.

The JTAG TMS and TCK pins are shared respectively with SWDIO and SWCLK and a

specific sequence on the TMS pin is used to switch between JTAG-DP and SW-DP.

DocID16455 Rev 9

21/96

95

Share Link: