Electrical characteristics
STM8S207xx, STM8S208xx
10.3.5
Memory characteristics
RAM and hardware registers
Table 35. RAM and hardware registers
Symbol
Parameter
Conditions
Min
Unit
VRM
Data retention mode(1)
Halt mode (or reset)
VIT-max(2)
V
1. Minimum supply voltage without losing data stored in RAM (in halt mode or under reset) or in hardware
registers (only in halt mode). Guaranteed by design, not tested in production.
2. Refer to Table 19 on page 56 for the value of VIT-max.
Flash program memory/data EEPROM memory
General conditions: TA = -40 to 125 °C.
Table 36. Flash program memory/data EEPROM memory
Symbol
Parameter
Conditions
Min(1) Typ Max Unit
VDD
Operating voltage
(all modes, execution/write/erase)
Standard programming time
(including erase) for byte/word/block
tprog (1 byte/4 bytes/128 bytes)
Fast programming time for 1 block
(128 bytes)
fCPU ≤ 24 MHz
2.95
5.5
V
6 6.6 ms
3 3.3 ms
terase
NRW
tRET
IDD
Erase time for 1 block (128 bytes)
Erase/write cycles(2)
(program memory)
Erase/write cycles (data memory)(2)
Data retention (program memory)
after 10 k erase/write cycles at
TA = 85 °C
Data retention (data memory) after 10
k erase/write cycles at TA = 85 °C
Data retention (data memory) after
300k erase/write cycles at
TA = 125 °C
Supply current (Flash programming or
erasing for 1 to 128 bytes)
TA = 85 °C
TA = 125 ° C
TRET = 55° C
TRET = 55° C
TRET = 85° C
3 3.3 ms
10 k
300 k 1M
cycles
20
20
years
1
2
mA
1. Data based on characterization results, not tested in production.
2. The physical granularity of the memory is 4 bytes, so cycling is performed on 4 bytes even when a
write/erase operation addresses a single byte.
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