M24C01/02-W M24C01/02-R M24C02-F
DC and AC parameters
Table 9. AC measurement conditions
Symbol
Parameter
Min.
Max.
Unit
Cbus
Load capacitance
SCL input rise/fall time, SDA input fall time
100
pF
-
50
ns
Input levels
Input and output timing reference levels
0.2 VCC to 0.8 VCC
V
0.3 VCC to 0.7 VCC
V
Figure 9. AC measurement I/O waveform
Input voltage levels
0.8VCC
0.2VCC
Input and output
Timing reference levels
0.7VCC
0.3VCC
MS19774V1
Symbol
Table 10. Input parameters
Parameter(1)
Test condition
CIN
Input capacitance (SDA)
CIN
Input capacitance (other pins)
ZL
Input impedance (WC)
ZH
1. Characterized only, not tested in production.
-
-
VIN < 0.3 VCC
VIN > 0.7 VCC
Min. Max. Unit
-
8
pF
-
6
pF
15 70 kΩ
500 -
kΩ
Symbol Parameter
Table 11. Cycling performance
Test condition(1)
Ncycle
Write cycle
endurance
TA ≤ 25 °C, VCC(min) < VCC < VCC(max)
TA = 85 °C, VCC(min) < VCC < VCC(max)
1. Cycling performance for products identified by process letter T.
Max.
4,000,000
1,200,000
Unit
Write cycle
Table 12. Memory cell data retention
Parameter
Data retention(1)
Test condition
TA = 55 °C
Min.
200
Unit
Year
1. For products identified by process letter T. The data retention behavior is checked in production, while the
200-year limit is defined from characterization and qualification results.
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