DC and AC parameters
M95256-DR, M95256, M95256-W, M95256-R
Table 17. AC characteristics (M95256, device grade 3)
Test conditions specified in Table 11: AC measurement conditions and Table 8: Operating
conditions (M95256)
Symbol Alt.
Parameter
Min.
fC
fSCK Clock frequency
D.C.
tSLCH tCSS1 S active setup time
90
tSHCH tCSS2 S not active setup time
90
tSHSL
tCS S deselect time
100
tCHSH tCSH S active hold time
90
tCHSL
S not active hold time
90
tCH (1) tCLH Clock high time
90
tCL (1)
tCLL Clock low time
90
tCLCH (2) tRC Clock rise time
tCHCL (2) tFC Clock fall time
tDVCH tDSU Data in setup time
20
tCHDX
tDH Data in hold time
30
tHHCH
Clock low hold time after HOLD not active
70
tHLCH
Clock low hold time after HOLD active
40
tCLHL
Clock low setup time before HOLD active
0
tCLHH
Clock low setup time before HOLD not active
0
tSHQZ (2) tDIS Output disable time
tCLQV
tV Clock low to output valid
tCLQX
tHO Output hold time
0
tQLQH (2) tRO Output rise time
tQHQL (2) tFO Output fall time
tHHQV
tLZ HOLD high to output valid
tHLQZ (2) tHZ HOLD low to output High-Z
tW
tWC Write time
1. tCH + tCL must never be less than the shortest possible clock period, 1 / fC(max)
2. Value guaranteed by characterization, not tested in production.
Max.
5
1
1
100
60
50
50
50
100
5
Unit
MHz
ns
ns
ns
ns
ns
ns
ns
µs
µs
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ms
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Doc ID 12276 Rev 11