STM8AF6268TC View Datasheet(PDF) - STMicroelectronics

Part Name

Description

Manufacturer

STM8AF6268TC

Automotive 8-bit MCU, with up to32 Kbytes Flash, data EEPROM, 10-bit ADC, timers, LIN, SPI, I2C, 3 to 5.5V

STMicroelectronics 

Electrical characteristics

STM8AF61xx, STM8AF62xx

Electromagnetic interference (EMI)

Emission tests conform to the SAE J 1752/3 standard for test software, board layout and pin

loading.

Table 45. EMI data

Conditions

Symbol

Parameter

General conditions

Monitored

frequency band

Max fCPU(1)

8

16

MHz MHz

Unit

SEMI

Peak level

VDD = 5 V,

0.1 MHz to 30 MHz 15

TA = 25 °C,

30 MHz to 130 MHz 18

LQFP80 package

conforming to SAE J 130 MHz to 1 GHz

-1

SAE EMI level 1752/3

—

2

17

22

dBµV

3

2.5

1. Data based on characterization results, not tested in production.

Absolute maximum ratings (electrical sensitivity)

Based on two different tests (ESD and LU) using specific measurement methods, the

product is stressed to determine its performance in terms of electrical sensitivity. For more

details, refer to the application note AN1181.

Electrostatic discharge (ESD)

Electrostatic discharges (3 positive then 3 negative pulses separated by 1 second) are

applied to the pins of each sample according to each pin combination. The sample size

depends on the number of supply pins in the device (3 parts*(n+1) supply pin). This test

conforms to the JESD22-A114A/A115A standard. For more details, refer to the application

note AN1181.

Table 46. ESD absolute maximum ratings

Symbol

Ratings

Conditions

Maximum

Class value(1) Unit

VESD(HBM)

Electrostatic discharge voltage

(Human body model)

TA = 25°C, conforming to

JESD22-A114

3A

4000

VESD(CDM)

Electrostatic discharge voltage

(Charge device model)

TA= 25°C, conforming to

JESD22-C101

3

500

V

VESD(MM)

Electrostatic discharge voltage

(Machine model)

TA= 25°C, conforming to

JESD22-A115

B

200

1. Data based on characterization results, not tested in production

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Doc ID 14952 Rev 6

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