NXP Semiconductors
LPC2131/32/34/36/38
Single-chip 16/32-bit microcontrollers
15
IDD (mA)
10
5
002aab403
(1)
(2)
(3)
(4)
(5)
0
0
10
20
30
40
50
60
frequency (MHz)
Test conditions: Idle mode entered executing code from flash; all peripherals are enabled in PCONP register;
PCLK = CCLK/4.
(1) VDD = 3.6 V at 140 C (max)
(2) VDD = 3.6 V at 60 C
(3) VDD = 3.6 V at 25 C
(4) VDD = 3.3 V at 25 C (typical)
(5) VDD = 3.3 V at 95 C (typical)
Fig 9. IDD idle measured at different frequencies (CCLK) and temperatures
500
IDD (μA)
400
300
002aab405
(1)
(2)
(3)
(4)
200
100
0
−60
−20
20
60
100
140
temp °(C)
Test conditions: Power-down mode entered executing code from flash; all peripherals are enabled in PCONP register.
(1) VDD = 3.6 V
(2) VDD = 3.3 V (max)
(3) VDD = 3.0 V
(4) VDD = 3.3 V (typical)
Fig 10. IDD(pd) measured at different temperatures
LPC2131_32_34_36_38
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 5.1 — 29 July 2011
© NXP B.V. 2011. All rights reserved.
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