Electrical characteristics
STM32WB55xx STM32WB35xx
Prequalification trials
Most of the common failures (unexpected reset and program counter corruption) can be
reproduced by manually forcing a low state on the NRST pin or the Oscillator pins for
1 second.
To complete these trials, ESD stress can be applied directly on the device, over the range of
specification values. When unexpected behavior is detected, the software can be hardened
to prevent unrecoverable errors occurring (see application note AN1015).
Electromagnetic Interference (EMI)
The electromagnetic field emitted by the device are monitored while a simple application is
executed (toggling two LEDs through the I/O ports). This emission test is compliant with the
IEC 61967-2 standard, which specifies the test board and the pin loading.
Table 68. EMI characteristics
Symbol Parameter
Conditions
Monitored
frequency band
SEMI
Peak level
VDD = 3.6 V, TA = 25 °C,ï€
WLCSP100 packageï€
compliant with IEC 61967-2
0.1 MHz to 30 MHz
30 MHz to 130 MHz
130 MHz to 1 GHz
1 GHz to 2 GHz
EMI level
Peripheral ON
SMPS OFF or ON
[fHSE / fCPUM4, fCPUM0]
Unit
32 MHz / 64 MHz, 32 MHz
1
4
dBµV
-1
7
1.5
-
6.3.15
Electrical sensitivity characteristics
Based on three different tests (ESD, LU) using specific measurement methods, the device is
stressed to determine its performance in terms of electrical sensitivity.
Electrostatic discharge (ESD)
Electrostatic discharges (a positive then a negative pulse separated by 1 second) are
applied to the pins of each sample according to each pin combination. The sample size
depends on the number of supply pins in the device (3 parts × (n+1) supply pins). This test
conforms to the ANSI/JEDEC standard.
Symbol
Table 69. ESD absolute maximum ratings
Ratings
Conditions
Class Maximum value(1) Unit
VESD(HBM)
Electrostatic discharge voltage
(human body model)
TA = +25 °C, conforming to
ANSI/ESDA/JEDEC JS-001
2
2000
VESD(CDM)
Electrostatic discharge voltage
(charge device model)
TA = +25 °C, conforming to
ANSI/ESD STM5.3.1 JS-002
C2a(2)
C1(3)
500(2)
250(3)
V
1. Guaranteed by characterization results.
2. UFQFPN48, VFQPN68 and WLCSP100 packages.
3. UFBGA129 package.
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