STM32F405REH6TR データシートの表示（PDF） - STMicroelectronics

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STM32F405REH6TR

ARM Cortex-M4 32b MCU+FPU, 210DMIPS, up to 1MB Flash/192+4KB RAM, USB OTG HS/FS, Ethernet, 17 TIMs, 3 ADCs, 15 comm. interfaces & camera

STMicroelectronics 

STM32F405xx, STM32F407xx

Electrical characteristics

Table 74. DAC characteristics (continued)

Symbol

Parameter

Min Typ

Max

Unit

Comments

Max frequency for a correct

Update DAC_OUT change when

rate(2) small variation in the input

-

-

code (from code i to i+1LSB)

Wakeup time from off state

tWAKEUP(4) (Setting the ENx bit in the

DAC Control register)

- 6.5

Power supply rejection ratio

PSRR+ (2) (to VDDA) (static DC

- –67

measurement)

1

MS/s

CLOAD ≤ 50 pF,

RLOAD ≥ 5 kΩ

CLOAD ≤ 50 pF, RLOAD ≥ 5 kΩ

10

µs input code between lowest and

highest possible ones.

–40

dB No RLOAD, CLOAD = 50 pF

1.

aVnDDe/xVteDrDnAaml pinoiwmeurmsuvpaplulyesoufp1e.r7viVsoisr

obtained when the device

(refer to Section : Internal

operates in reduced

reset OFF).

temperature

range,

and

with

the

use

of

2. Guaranteed by design, not tested in production.

3. The quiescent mode corresponds to a state where the DAC maintains a stable output level to ensure that no dynamic

consumption occurs.

4. Guaranteed by characterization, not tested in production.

5.3.25

Figure 54. 12-bit buffered /non-buffered DAC

Buffered/Non-buffered DAC

Buffer(1)

12-bit

digital to

analog

converter

DACx_OUT

R LOAD

C LOAD

ai17157

1. The DAC integrates an output buffer that can be used to reduce the output impedance and to drive external

loads directly without the use of an external operational amplifier. The buffer can be bypassed by

configuring the BOFFx bit in the DAC_CR register.

FSMC characteristics

Unless otherwise specified, the parameters given in Table 75 to Table 86 for the FSMC

interface are derived from tests performed under the ambient temperature, fHCLK frequency

and VDD supply voltage conditions summarized in Table 14, with the following configuration:

• Output speed is set to OSPEEDRy[1:0] = 10

• Capacitive load C = 30 pF

• Measurement points are done at CMOS levels: 0.5VDD

Refer to Section Section 5.3.16: I/O port characteristics for more details on the input/output

characteristics.

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