LC4256ZC-45T176AS データシートの表示（PDF） - Lattice Semiconductor

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LC4256ZC-45T176AS

3.3V/2.5V/1.8V In-System Programmable SuperFAST High Density PLDs

Lattice Semiconductor 

Lattice Semiconductor

ispMACH 4000V/B/C/Z Family Data Sheet

Switching Test Conditions

Figure 12 shows the output test load that is used for AC testing. The specific values for resistance, capacitance,

voltage, and other test conditions are shown in Table 11.

Figure 12. Output Test Load, LVTTL and LVCMOS Standards

VCCO

R1

DUT

Test

Point

R2

CL

Table 11. Test Fixture Required Components

Test Condition

R1 R2

LVCMOS I/O, (L -> H, H -> L)

106Ω 106Ω

LVCMOS I/O (Z -> H)

∞ 106Ω

LVCMOS I/O (Z -> L)

106Ω ∞

LVCMOS I/O (H -> Z)

∞ 106Ω

LVCMOS I/O (L -> Z)

106Ω ∞

1. CL includes test fixtures and probe capacitance.

CL1

35pF

35pF

35pF

5pF

5pF

0213A/ispm4k

Timing Ref.

LVCMOS 3.3 = 1.5V

LVCMOS 2.5 = VCCO/2

LVCMOS 1.8 = VCCO/2

1.5V

1.5V

VOH - 0.3

VOL + 0.3

VCCO

LVCMOS 3.3 = 3.0V

LVCMOS 2.5 = 2.3V

LVCMOS 1.8 = 1.65V

3.0V

3.0V

3.0V

3.0V

41

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