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STM32F100R8T7BTR(2010) データシートの表示(PDF) - STMicroelectronics

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STM32F100R8T7BTR Datasheet PDF : 84 Pages
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STM32F100x4, STM32F100x6, STM32F100x8, STM32F100xB
Electrical characteristics
Table 45. DAC characteristics (continued)
Symbol
Parameter
Min Typ Max(1) Unit
Comments
Offset(3)
Offset error
(difference between measured value
at Code (0x800) and the ideal value =
VREF+/2)
Gain
error(3)
Gain error
tSETTLING(
3)
Settling time (full scale: for a 10-bit
input code transition between the
lowest and the highest input codes
when DAC_OUT reaches final value
±1LSB
Update
rate(3)
Max frequency for a correct
DAC_OUT change when small
variation in the input code (from code i
to i+1LSB)
Wakeup time from off state (Setting
tWAKEUP(3) the ENx bit in the DAC Control
register)
PSRR+ (1)
Power supply rejection ratio (to VDDA)
(static DC measurement
±10
±3
±12
±0.5
mV
Given for the DAC in 12-bit
configuration
LSB
Given for the DAC in 10-bit at
VREF+ = 3.6 V
LSB
Given for the DAC in 12-bit at
VREF+ = 3.6 V
%
Given for the DAC in 12bit
configuration
3
4
µs CLOAD 50 pF, RLOAD 5 k
1
MS/s CLOAD 50 pF, RLOAD 5 k
6.5 10
–67 –40
CLOAD 50 pF, RLOAD 5 k
µs input code between lowest and
highest possible ones.
dB No RLOAD, CLOAD = 50 pF
1. Guaranteed by characterization, not tested in production.
2. Guaranteed by design, not tested in production.
3. Guaranteed by characterization, not tested in production.
Figure 35. 12-bit buffered /non-buffered DAC
Buffered/Non-buffered DAC
Buffer(1)
12-bit
digital to
analog
converter
DACx_OUT
R LOAD
C LOAD
ai17157
1. The DAC integrates an output buffer that can be used to reduce the output impedance and to drive external loads directly
without the use of an external operational amplifier. The buffer can be bypassed by configuring the BOFFx bit in the
DAC_CR register.
5.3.18 Temperature sensor characteristics
Doc ID 16455 Rev 2
71/84

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