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STM32F100RBH7B データシートの表示(PDF) - STMicroelectronics

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STM32F100RBH7B Datasheet PDF : 96 Pages
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Electrical characteristics
STM32F100x4, STM32F100x6, STM32F100x8, STM32F100xB
Symbol
Table 46. DAC characteristics (continued)
Parameter
Min Typ
Max(1)
Unit
Comments
Offset error
-
-
Offset(1)
(difference between measured
value at Code (0x800) and the
-
-
ideal value = VREF+/2)
-
-
Gain
error(1)
Gain error
-
-
Settling time (full scale: for a 10-
bit input code transition between
tSETTLING(1) the lowest and the highest input -
3
codes when DAC_OUT reaches
final value ±1LSB
Update
rate(1)
Max frequency for a correct
DAC_OUT change when small
variation in the input code (from
-
-
code i to i+1LSB)
tWAKEUP(1)
Wakeup time from off state
(Setting the ENx bit in the DAC
Control register)
- 6.5
±10
mV
Given for the DAC in 12-bit
configuration
±3
LSB
Given for the DAC in 10-bit at
VREF+ = 3.6 V
±12
LSB
Given for the DAC in 12-bit at
VREF+ = 3.6 V
±0.5
%
Given for the DAC in 12bit
configuration
4
µs CLOAD 50 pF, RLOAD 5 kΩ
1
MS/s CLOAD 50 pF, RLOAD 5 kΩ
CLOAD 50 pF, RLOAD 5 kΩ
10
µs input code between lowest and
highest possible ones.
PSRR+ (1)
Power supply rejection ratio (to
VDDA) (static DC measurement
- –67
–40
dB No RLOAD, CLOAD = 50 pF
1. Guaranteed by characterization results.
2. Guaranteed by design.
Figure 36. 12-bit buffered /non-buffered DAC
Buffered/Non-buffered DAC
12-bit
digital to
analog
converter
Buffer(1)
RL
DAC_OUTx
CL
ai17157V2
1. The DAC integrates an output buffer that can be used to reduce the output impedance and to drive external
loads directly without the use of an external operational amplifier. The buffer can be bypassed by
configuring the BOFFx bit in the DAC_CR register.
74/96
DocID16455 Rev 9

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