STM32F302CC データシートの表示（PDF） - STMicroelectronics

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STM32F302CC

ARM®-based Cortex®-M4 32b MCU+FPU, up to 256KB Flash+ 40KB SRAM, 2 ADCs, 1 DAC ch., 4 comp, 2 PGA, timers, 2.0-3.6 V

STMicroelectronics 

Electrical characteristics

STM32F302xB STM32F302xC

6.3.9

6.3.10

PLL characteristics

The parameters given in Table 46 are derived from tests performed under ambient

temperature and supply voltage conditions summarized in Table 24.

Table 46. PLL characteristics

Symbol

Parameter

Value

Unit

Min

Typ

Max

fPLL_IN

fPLL_OUT

tLOCK

Jitter

PLL input clock(1)

PLL input clock duty cycle

PLL multiplier output clock

PLL lock time

Cycle-to-cycle jitter

1(2)

-

40(2)

-

16(2)

-

-

-

-

-

24(2)

60(2)

72

200(2)

300(2)

MHz

%

MHz

µs

ps

1. Take care of using the appropriate multiplier factors so as to have PLL input clock values compatible with

the range defined by fPLL_OUT.

2. Guaranteed by design.

Memory characteristics

Flash memory

The characteristics are given at TA = –40 to 105 °C unless otherwise specified.

Table 47. Flash memory characteristics

Symbol

Parameter

Conditions

Min

tprog 16-bit programming time TA = –40 to +105 °C

40

tERASE Page (2 KB) erase time TA = –40 to +105 °C

20

tME Mass erase time

TA = –40 to +105 °C

20

Write mode

-

IDD Supply current

Erase mode

-

1. Guaranteed by design.

Typ Max(1) Unit

53.5 60

µs

-

40

ms

-

40

ms

-

10 mA

-

12 mA

Table 48. Flash memory endurance and data retention

Symbol

Parameter

Conditions

Value

Min(1)

NEND Endurance

TA = –40 to +85 °C (6 suffix versions)

TA = –40 to +105 °C (7 suffix versions)

10

1 kcycle(2) at TA = 85 °C

30

tRET Data retention

1 kcycle(2) at TA = 105 °C

10

10 kcycles(2) at TA = 55 °C

20

1. Guaranteed by characterization results.

2. Cycling performed over the whole temperature range.

Unit

kcycles

Years

80/144

DocID025186 Rev 7

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