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STM32F100RCT6BTR データシートの表示(PDF) - STMicroelectronics

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STM32F100RCT6BTR Datasheet PDF : 98 Pages
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Electrical characteristics
STM32F100xC, STM32F100xD, STM32F100xE
Table 55. DAC characteristics (continued)
Symbol
Parameter
Min Typ Max(1) Unit
Comments
Offset(1)
Offset error
(difference between measured value
at Code (0x800) and the ideal value =
VREF+/2)
Gain
error(1)
Gain error
Settling time (full scale: for a 10-bit
input code transition between the
tSETTLING(1) lowest and the highest input codes
when DAC_OUT reaches final value
±1LSB
Update
rate(1)
Max frequency for a correct
DAC_OUT change when small
variation in the input code (from code i
to i+1LSB)
tWAKEUP(1)
Wakeup time from off state (Setting
the ENx bit in the DAC Control
register)
PSRR+ (1)
Power supply rejection ratio (to VDDA)
(static DC measurement
±10
±3
±12
±0.5
mV
Given for the DAC in 12-bit
configuration
LSB
Given for the DAC in 10-bit at
VREF+ = 3.6 V
LSB
Given for the DAC in 12-bit at
VREF+ = 3.6 V
%
Given for the DAC in 12-bit
configuration
3
4
µs CLOAD 50 pF, RLOAD 5 kΩ
1
MS/s CLOAD 50 pF, RLOAD 5 kΩ
6.5 10
–67 –40
CLOAD 50 pF, RLOAD 5 kΩ
µs input code between lowest and
highest possible ones.
dB No RLOAD, CLOAD = 50 pF
1. Preliminary values.
2. Quiescent mode refer to the state of the DAC keeping steady value on the output, so no dynamic consumption is involved.
Figure 37. 12-bit buffered /non-buffered DAC
Buffered/Non-buffered DAC
Buffer(1)
12-bit
digital to
analog
converter
DACx_OUT
R LOAD
C LOAD
ai17157
1. The DAC integrates an output buffer that can be used to reduce the output impedance and to drive external loads directly
without the use of an external operational amplifier. The buffer can be bypassed by configuring the BOFFx bit in the
DAC_CR register.
86/98
Doc ID 15081 Rev 7

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