Functional overview
STM32WB55xx STM32WB35xx
3.14.1
3.14.2
– Data pre-processing: left/right alignment and per channel offset compensation
– Built-in oversampling unit for enhanced SNR
– Channel-wise programmable sampling time
– Three analog watchdog for automatic voltage monitoring, generating interrupts
and trigger for selected timers
– Hardware assistant to prepare the context of the injected channels to allow fast
context switching
Temperature sensor
The temperature sensor (TS) generates a voltage VTS that varies linearly with temperature.
The temperature sensor is internally connected to the ADC1_IN17 input channel, which is
used to convert the sensor output voltage into a digital value.
To improve the accuracy of the temperature sensor measurement, each device is
individually factory-calibrated by ST. The temperature sensor factory calibration data are
stored in the system memory area, accessible in read-only mode.
Table 11. Temperature sensor calibration values
Calibration value name
Description
Memory address
TS_CAL1
TS_CAL2
TS ADC raw data acquired at a
temperature of 30 °C (± 5 °C),
VDDA = VREF+ = 3.0 V (± 10 mV)
TS ADC raw data acquired at a
temperature of 130 °C (± 5 °C),
VDDA = VREF+ = 3.0 V (± 10 mV)
0x1FFF 75A8 - 0x1FFF 75A9
0x1FFF 75CA - 0x1FFF 75CB
Internal voltage reference (VREFINT)
The internal voltage reference (VREFINT) provides a stable (bandgap) voltage output for
the ADC and the comparators. VREFINT is internally connected to the ADC1_IN0 input
channel. The precise voltage of VREFINT is individually measured for each part by ST
during production test and stored in the system memory area. It is accessible in read-only
mode.
Table 12. Internal voltage reference calibration values
Calibration value name
Description
Memory address
VREFINT
Raw data acquired at a
temperature of 30 °C (± 5 °C),
VDDA = VREF+ = 3.6 V (± 10 mV)
0x1FFF 75AA - 0x1FFF 75AB
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DS11929 Rev 10