STM32F103VC 查看數據表（PDF） - STMicroelectronics

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STM32F103VC

Medium-density performance line ARM-based 32-bit MCU with 64 or 128 KB Flash, USB, CAN, 7 timers, 2 ADCs, 9 com. interfaces

STMicroelectronics 

STM32F103xC, STM32F103xD, STM32F103xE

Electrical characteristics

Figure 41. NAND controller waveforms for common memory write access

FSMC_NCEx Low

ALE (FSMC_A17)

CLE (FSMC_A16)

td(ALE-NOE)

FSMC_NWE

tw(NWE)

th(NOE-ALE)

FSMC_NOE

FSMC_D[15:0]

td(D-NWE)

tv(NWE-D)

th(NWE-D)

ai14913b

Table 40. Switching characteristics for NAND Flash read and write cycles(1)

Symbol

Parameter

Min

Max

Unit

td(D-NWE)(2)

tw(NOE)(2)

FSMC_D[15:0] valid before FSMC_NWE high

FSMC_NOE low width

6THCLK + 12

ns

4THCLK – 1.5 4THCLK + 1.5 ns

tsu(D-NOE)(2)

FSMC_D[15:0] valid data before FSMC_NOE

high

25

ns

th(NOE-D)(2) FSMC_D[15:0] valid data after FSMC_NOE high 7

ns

tw(NWE)(2)

FSMC_NWE low width

4THCLK – 1 4THCLK + 2.5 ns

tv(NWE-D)(2) FSMC_NWE low to FSMC_D[15:0] valid

0

ns

th(NWE-D)(2) FSMC_NWE high to FSMC_D[15:0] invalid

10THCLK + 4

ns

td(ALE-NWE)(3) FSMC_ALE valid before FSMC_NWE low

3THCLK + 1.5 ns

th(NWE-ALE)(3) FSMC_NWE high to FSMC_ALE invalid

3THCLK + 4.5

ns

td(ALE-NOE)(3) FSMC_ALE valid before FSMC_NOE low

3THCLK + 2 ns

th(NOE-ALE)(3) FSMC_NWE high to FSMC_ALE invalid

3THCLK + 4.5

ns

1. CL = 15 pF.

2. Based on characterization, not tested in production.

3. Guaranteed by design, not tested in production.

Doc ID 14611 Rev 7

79/123

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