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ATXMEGA32A4-MH 查看數據表(PDF) - Atmel Corporation

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ATXMEGA32A4-MH
Atmel
Atmel Corporation 
ATXMEGA32A4-MH Datasheet PDF : 107 Pages
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XMEGA A4
34.5 ADC Characteristics
Table 34-5. ADC Characteristics
Symbol Parameter
RES
Resolution
INL
Integral Non-Linearity
DNL
Differential Non-Linearity
Gain Error
Offset Error
ADCclk
ADC Clock frequency
Conversion rate
Conversion time
(propagation delay)
Sampling Time
Conversion range
AVCC Analog Supply Voltage
VREF Reference voltage
Input bandwidth
INT1V Internal 1.00V reference
INTVCC
SCALEDVCC
RAREF
Internal VCC/1.6
Scaled internal VCC/10 input
Reference input resistance
Start-up time
Internal input sampling speed
Condition
Min
Programmable: 8/12
8
500 ksps
-5
500 ksps
Max is 1/4 of Peripheral Clock
(RES+2)/2+GAIN
RES = 8 or 12, GAIN = 0 or 1
1/2 ADCclk cycle
5
0.25
0
Vcc-0.3
1.0
Temp. sensor, VCC/10, Bandgap
Typ
12
±2
< ±1
< ±10
< ±2
7
1.00
VCC/1.6
VCC/10
> 10
12
Max
Units
12
Bits
5
LSB
mV
2000
2000
8
VREF
Vcc+0.3
Vcc-0.6V
kHz
ksps
ADCclk
cycles
uS
V
kHz
V
MΩ
24
ADCclk
cycles
100
ksps
Table 34-6. ADC Gain Stage Characteristics
Symbol Parameter
Condition
Gain error
1 to 64 gain
Offset error
Vrms
Noise level at input
64x gain
VREF = Int. 1V
VREF = Ext. 2V
Clock rate
Same as ADC
Min
Typ
Max
Units
< ±1
%
< ±1
0.12
mV
0.06
1000
kHz
65
8069O–AVR–08/10

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