STM32F205RF 查看數據表（PDF） - STMicroelectronics

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STM32F205RF

ARM-based 32-bit MCU, 150DMIPs, up to 1 MB Flash/128+4KB RAM, USB OTG HS/FS, Ethernet, 17 TIMs, 3 ADCs, 15 comm. interfaces & camera

STMicroelectronics 

STM32F20xxx

Electrical characteristics

Table 42. Electrical sensitivities

Symbol

Parameter

Conditions

LU

Static latch-up class

TA = +105 °C conforming to JESD78A

Class

II level A

5.3.15

I/O current injection characteristics

As a general rule, current injection to the I/O pins, due to external voltage below VSS or

above VDD (for standard, 3 V-capable I/O pins) should be avoided during normal product

operation. However, in order to give an indication of the robustness of the microcontroller in

cases when abnormal injection accidentally happens, susceptibility tests are performed on a

sample basis during device characterization.

Functional susceptibilty to I/O current injection

While a simple application is executed on the device, the device is stressed by injecting

current into the I/O pins programmed in floating input mode. While current is injected into the

I/O pin, one at a time, the device is checked for functional failures.

The failure is indicated by an out of range parameter: ADC error above a certain limit (>5

LSB TUE), out of spec current injection on adjacent pins or other functional failure (for

example reset, oscillator frequency deviation).

The test results are given in Table 43.

Table 43. I/O current injection susceptibility

Symbol

Description

Functional susceptibility

Negative

Positive

Unit

injection

injection

Injected current on all FT pins

IINJ

Injected current on any other pin

–5

+0

mA

–5

+5

Doc ID 15818 Rev 9

95/177

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