STM32F407OGT7 查看數據表（PDF） - STMicroelectronics

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STM32F407OGT7

ARM Cortex-M4 32b MCU+FPU, 210DMIPS, up to 1MB Flash/192+4KB RAM, USB OTG HS/FS, Ethernet, 17 TIMs, 3 ADCs, 15 comm. interfaces & camera

STMicroelectronics 

Electrical characteristics

STM32F405xx, STM32F407xx

EG = Gain Error: deviation between the last ideal transition and the last actual one.

ED = Differential Linearity Error: maximum deviation between actual steps and the ideal one.

EL = Integral Linearity Error: maximum deviation between any actual transition and the end point

correlation line.

Figure 51. Typical connection diagram using the ADC

RAIN(1) AINx

VAIN

Cparasitic

VDD

VT

0.6 V

VT

0.6 V

STM32F

Sample and hold ADC

converter

RADC(1) 12-bit

converter

IL±1 µA

CADC(1)

ai17534

1. Refer to Table 67 for the values of RAIN, RADC and CADC.

2.

Cpapdaracsaitpicarceitparnecseen(rtsouthgehlcya5papcFit)a. nAcheigohf

fADC should be reduced.

the PCB

Cparasitic

(dependent on soldering and PCB layout

value downgrades conversion accuracy.

quality) plus the

To remedy this,

132/185

DocID022152 Rev 4

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