STM32F101R6T6TR 查看數據表（PDF） - STMicroelectronics

零件编号

产品描述 (功能)

生产厂家

STM32F101R6T6TR

Low-density access line, ARM-based 32-bit MCU with 16 or 32 KB Flash, 5 timers, ADC and 4 communication interfaces

STMicroelectronics 

Electrical characteristics

STM32F101x4, STM32F101x6

Table 45.

Symbol

ADC accuracy(1) (2) (3)

Parameter

Test conditions

Typ Max(4) Unit

ET Total unadjusted error

EO Offset error

EG Gain error

ED Differential linearity error

EL Integral linearity error

fPCLK2 = 28 MHz,

fADC = 14 MHz, RAIN < 10 kΩ,

VDDA = 2.4 V to 3.6 V

Measurements made after

ADC calibration

±2

±1.5

±1.5

±1

±1.5

±5

±2.5

±3

LSB

±2

±3

1. ADC DC accuracy values are measured after internal calibration.

2. Better performance could be achieved in restricted VDD, frequency and temperature ranges.

3. ADC Accuracy vs. Negative Injection Current: Injecting negative current on any of the standard (non-

robust) analog input pins should be avoided as this significantly reduces the accuracy of the conversion

being performed on another analog input. It is recommended to add a Schottky diode (pin to ground) to

standard analog pins which may potentially inject negative current.

Any positive injection current within the limits specified for IINJ(PIN) and ΣIINJ(PIN) in Section 5.3.12 does not

affect the ADC accuracy.

4. Based on characterization, not tested in production.

Figure 32. ADC accuracy characteristics

[1LSBIDEAL

=

VDDA

4096

4095

4094

4093

7

6

5

EO

4

3

2

1

(2)

ET

(3)

EL

ED

1 LSBIDEAL

EG

(1)

(1) Example of an actual transfer curve

(2) The ideal transfer curve

(3) End point correlation line

ET=Total u nadjusted er ror: maximum deviation

between the actual and the ideal transfer curves.

EO=Offset e rror: deviation between the first actual

transition and the first ideal one.

EG=Gain er ror: deviation between the last ideal

transition and the last actual one.

ED=Differential linearity error: maximum deviation

between actual steps and the ideal one.

EL=Integral linearity error: maximum deviation

between any actual transition and the end point

correlation line.

0

1234567

VSSA

4093 4094 4095 4096

VDDA

ai15497

66/79

Doc ID 15058 Rev 5

Share Link: