MX29F040
ERASE AND PROGRAMMING PERFORMANCE (1)
PARAMETER
MIN.
LIMITS
TYP.(2)
Sector Erase Time
1.3
Chip Erase Time
4
Byte Programming Time
7
Chip Programming Time
4
Erase/Program Cycles
100,000
Note: 1.Not 100% Tested, Excludes external system level over head.
2.Typical values measured at 25° C,5V.
3.Maximunm values measured at 25° C,4.5V.
MAX.(3)
10.4
32
210
12
UNITS
sec
sec
us
sec
Cycles
LATCH-UP CHARACTERISTICS
Input Voltage with respect to GND on all pins except I/O pins
Input Voltage with respect to GND on all I/O pins
Current
Includes all pins except Vcc. Test conditions: Vcc = 5.0V, one pin at a time.
MIN.
-1.0V
-1.0V
-100mA
MAX.
13.5V
Vcc + 1.0V
+100mA
DATA RETENTION
PARAMETER
Data Retention Time
MIN.
20
UNIT
Years
P/N:PM0538
REV. 2.3, DEC. 10, 2004
33