STM32F051x4 STM32F051x6 STM32F051x8
Electrical characteristics
6.3.4
6.3.5
Table 23. Programmable voltage detector characteristics (continued)
Symbol
Parameter
Conditions Min Typ Max Unit
VPVD6
PVD threshold 6
Rising edge
2.66 2.78 2.9
V
Falling edge 2.56 2.68 2.8
V
VPVD7
PVD threshold 7
VPVDhyst(1) PVD hysteresis
IDD(PVD) PVD current consumption
1. Guaranteed by design, not tested in production.
Rising edge
Falling edge
-
-
2.76 2.88
3
V
2.66 2.78 2.9
V
-
100
-
mV
-
0.15 0.26(1) µA
Embedded reference voltage
The parameters given in Table 24 are derived from tests performed under the ambient
temperature and supply voltage conditions summarized in Table 20: General operating
conditions.
Table 24. Embedded internal reference voltage
Symbol
Parameter
Conditions
Min Typ Max Unit
VREFINT Internal reference voltage –40 °C < TA < +105 °C 1.2 1.23 1.25
V
tSTART
ADC_IN17 buffer startup
time
-
-
- 10(1)
µs
ADC sampling time when
tS_vrefint reading the internal
-
reference voltage
4(1)
-
-
µs
∆VREFINT
Internal reference voltage
spread over the
temperature range
VDDA = 3 V
-
-
10(1)
mV
TCoeff
Temperature coefficient
-
1. Guaranteed by design, not tested in production.
- 100(1) - 100(1) ppm/°C
Supply current characteristics
The current consumption is a function of several parameters and factors such as the
operating voltage, ambient temperature, I/O pin loading, device software configuration,
operating frequencies, I/O pin switching rate, program location in memory and executed
binary code.
The current consumption is measured as described in Figure 14: Current consumption
measurement scheme.
All Run-mode current consumption measurements given in this section are performed with a
reduced code that gives a consumption equivalent to CoreMark code.
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