STM32L151CCY7TR 查看數據表（PDF） - STMicroelectronics

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STM32L151CCY7TR

Ultra-low-power 32-bit MCU ARM®-based Cortex®-M3, 256KB Flash, 32KB SRAM, 8KB EEPROM, LCD, USB, ADC, DAC

STMicroelectronics 

STM32L151xC STM32L152xC

Electrical characteristics

6.3.3

Embedded internal reference voltage

The parameters given in Table 17 are based on characterization results, unless otherwise

specified.

Table 16. Embedded internal reference voltage calibration values

Calibration value name

Description

Memory address

VREFINT_CAL

Raw data acquired at

temperature of 30 °C ±5 °C

VDDA= 3 V ±10 mV

0x1FF8 00F8 - 0x1FF8 00F9

Table 17. Embedded internal reference voltage

Symbol

Parameter

Conditions

Min Typ

VREFINT out (1)

IREFINT

Internal reference voltage

Internal reference current

consumption

– 40 °C < TJ < +110 °C 1.202 1.224

-

-

1.4

TVREFINT

Internal reference startup time

-

-

2

VVREF_MEAS

VDDA and VREF+ voltage during

VREFINT factory measure

-

2.99 3

AVREF_MEAS

Accuracy

value(2)

of

factory-measured

VREF

Including uncertainties

due to ADC and

VDDA/VREF+ values

-

-

TCoeff(3)

Temperature coefficient

–40 °C < TJ < +110 °C

-

25

ACoeff(3)

VDDCoeff(3)

Long-term stability

Voltage coefficient

1000 hours, T= 25 °C

-

-

3.0 V < VDDA < 3.6 V

-

-

TS_vrefint(3)

ADC sampling time when reading

the internal reference voltage

-

4

-

TADC_BUF(3) (4)

Startup time of reference voltage

buffer for ADC

-

-

-

IBUF_ADC(3)

Consumption of reference voltage

buffer for ADC

-

- 13.5

IVREF_OUT(3)

CVREF_OUT(3)

VREF_OUT output current (5)

VREF_OUT output load

-

-

-

-

-

-

ILPBUF(3)

Consumption of reference voltage

buffer for VREF_OUT and COMP

-

- 730

VREFINT_DIV1(3)

VREFINT_DIV2(3)

VREFINT_DIV3(3)

1/4 reference voltage

1/2 reference voltage

3/4 reference voltage

-

24 25

-

49 50

-

74 75

1. Guaranteed by test in production.

2. The internal VREF value is individually measured in production and stored in dedicated EEPROM bytes.

3. Guaranteed by characterization results.

4. Shortest sampling time can be determined in the application by multiple iterations.

Max

1.242

2.3

3

3.01

±5

100

1000

2000

-

10

25

1

50

1200

26

51

76

Unit

V

µA

ms

V

mV

ppm/°

C

ppm

ppm/V

µs

µs

µA

µA

pF

nA

%

VREFIN

T

DocID022799 Rev 13

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