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STM32F302CC 查看數據表(PDF) - STMicroelectronics

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STM32F302CC Datasheet PDF : 144 Pages
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STM32F302xB STM32F302xC
Electrical characteristics
Table 30. Typical and maximum current consumption from VDD supply at VDD = 3.6V (continued)
All peripherals enabled
All peripherals disabled
Symbol Parameter Conditions
fHCLK
Max @ TA(1)
Max @ TA(1)
Unit
Typ
Typ
25 °C 85 °C 105 °C
25 °C 85 °C 105 °C
72 MHz 44.0 48.4 49.4 50.5 6.6 7.5 7.9
64 MHz 39.2 43.3 44.0 45.2 6.0 6.8 7.2
External
48 MHz 29.6 32.7 33.3 34.3 4.5 5.2
5.6
clock (HSE 32 MHz 19.7 23.3 23.3 23.5 3.1 3.5 4.0
Supply
bypass)
current in
24 MHz 14.9 17.6 17.8 18.3 2.4 2.8 3.3
Sleep
IDD mode,
executing
8 MHz 4.9 5.7 6.1
1 MHz 0.6 0.9 1.2
6.9 0.8 1.0 1.4
2.1 0.1 0.3 0.6
from Flash
or RAM
64 MHz 34.2 38.1 39.2 40.3 5.7 6.3 6.8
48 MHz 25.8 28.7 29.6 30.3 4.3 4.8 5.2
Internal
clock (HSI)
32 MHz 17.4
19.4
19.9
20.7
2.9
3.2
3.7
24 MHz 13.2 15.1 15.6 15.9 1.5 1.8 2.2
8 MHz 4.5 5.0 5.6 6.2 0.7 0.9 1.2
8.7
7.9
6.3
4.8
3.9
2.2
mA
1.5
7.5
5.9
4.5
2.9
2.1
1. Guaranteed by characterization results unless otherwise specified.
2. Data based on characterization results and tested in production with code executing from RAM.
Table 31. Typical and maximum current consumption from the VDDA supply
VDDA = 2.4 V
VDDA = 3.6 V
Symbol
Parameter
Conditions
(1)
fHCLK
Max @ TA(2)
Max @ TA(2)
Unit
Typ
Typ
25 °C 85 °C 105 °C
25 °C 85 °C 105 °C
72 MHz 225 276 289 297 245 302 319 329
64 MHz 198 249 261 268 216 270 284 293
48 MHz 149 195 204 211 159 209 222 230
Supply
current in
HSE
bypass
32 MHz 102
145
24 MHz 80 119
152
124
157 110 154 162
128 86 126 131
169
135
Run/Sleep
IDDA
mode,
code
8 MHz 2
3
4
6
3
4
5
9
µA
1 MHz 2
3
5
7
3
4
6
9
executing
from Flash
64 MHz 270 323 337 344 299 354 371 381
or RAM
48 MHz 220 269 280 286 244 293 309 318
HSI clock 32 MHz 173 218 228 233 193 239 251 257
24 MHz 151 194 200 204 169 211 219 225
8 MHz 73
97
99 103 88 105 110 116
1.
Current consumption from the
PLL is off, IDDA is independent
VfrDoDmA
supply is independent
the frequency.
of
whether
the
peripherals
are
on
or
off.
Furthermore
when
the
2. Guaranteed by characterization results.
DocID025186 Rev 7
63/144
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